Who publishes IEEE Design & Test?

IEEE Design & Test is published by IEEE.

What is the ISSN of IEEE Design & Test?

The ISSN of IEEE Design & Test is 2168-2356.

What is the impact factor of IEEE Design & Test?

The reported impact factor of IEEE Design & Test is 1.9. Impact factor values are reproduced from publishers and may lag the latest JCR release.

Journal Information

IEEE Design & Test

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Impact Factor:

1.9

Publisher:

IEEE

ISSN:

2168-2356

Viewed:

8727

Tracked:

0

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Call For Papers

IEEE Design & Test is an academic journal published by IEEE. (ISSN 2168-2356, impact factor 1.9).

Aims & Scope IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.

Last updated by Dou Sun on 2026-01-10

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Related Conferences

CCF	ICORE	CP-I	Short	Full Name	Submission	Conference
		45.0	IDT	IEEE International Design & Test Symposium	2015-10-11	2015-12-14
		42.1	DTS	IEEE international conference on Design & Test of integrated micro & nano-Systems	2019-02-04	2019-04-28
		42.8	IEEE S&B	IEEE Security & Privacy on the Blockchain Workshop	2021-05-21	2021-09-07
		52.6	VDAT	International Symposium on VLSI Design and Test	2026-04-30	2026-08-20
		56.2	MDTS	Microelectronics Design and Test Symposium	2027-01-10	2027-05-17
B	A	92.8	DATE	Design, Automation and Test in Europe	2026-09-07	2027-03-22
	C	51.7	AST	ACM/IEEE International Conference on Automation of Software Test	2026-10-30	2027-04-26
C	B	58.1	IEEE CLOUD	IEEE International Conference on Cloud Computing	2023-03-25	2023-07-02
B	A	89.1	ITC	International Test Conference	2026-03-20	2026-10-11
		48.6	HLDVT	International High-Level Design, Validation, and Test Workshop	2016-07-24	2016-10-07

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