Conference Information
ITC 2020: International Test Conference
http://www.itctestweek.org/
Submission Date:
2020-03-27
Notification Date:
2020-06-15
Conference Date:
2020-11-03
Location:
Washington DC, USA
CCF: b   CORE: b   QUALIS: a1   Viewed: 13718   Tracked: 13   Attend: 0

Conference Location
Call For Papers
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-fortest, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

ITC 2020 starts the second half century of the conference. Emerging technologies such as optical, biomedical, and quantum devices will require new test solutions. Artificial Intelligence (AI) and the need for trustworthy devices are providing both new challenges and new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially in automotive applications, are requiring more efficient test, debug, monitoring, and repair techniques that can transfer to the field.

Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. Of particular interest are works dedicated to the topics listed on the right and/or works related to the conference theme and/or works focused on special tracks such as Automotive, AI, or Security. Authors are also invited to submit practical, industry best practices papers. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.
Last updated by Dou Sun in 2019-12-02
Acceptance Ratio
YearSubmittedAcceptedAccepted(%)
20142506224.8%
20132504618.4%
20122506124.4%
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Related Journals
CCFFull NameImpact FactorPublisherISSN
Journal of Heuristics1.471Springer1381-1231
International Journal of Human Capital and Information Technology ProfessionalsIGI Global Publishing1947-3478
ICT ExpressElsevier2405-9595
IEEE Access4.098IEEE2169-3536
Advanced Robotics0.920Taylor & Francis0169-1864
cReal-Time Systems0.550Springer0922-6443
International Journal of Information Systems and Supply Chain ManagementIGI Global1935-5726
IEEE Network7.197IEEE0890-8044
Sensors3.031MDPI1424-8220
Mobile Information Systems0.849Hindawi1574-017X
Full NameImpact FactorPublisher
Journal of Heuristics1.471Springer
International Journal of Human Capital and Information Technology ProfessionalsIGI Global Publishing
ICT ExpressElsevier
IEEE Access4.098IEEE
Advanced Robotics0.920Taylor & Francis
Real-Time Systems0.550Springer
International Journal of Information Systems and Supply Chain ManagementIGI Global
IEEE Network7.197IEEE
Sensors3.031MDPI
Mobile Information Systems0.849Hindawi
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