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Conference Information
ITC 2026: International Test Conference
https://www.itctestweek.org/
Submission Date:
2026-03-20
Notification Date:
2026-06-19
Conference Date:
2026-10-11
Location:
San Antonio, Texas, USA
CCF: b   CORE: b   QUALIS: a1   Viewed: 142817   Tracked: 24   Attend: 0

Call For Papers 
ITC invites submissions on the latest advances in test, validation, diagnosis, implementation, and scalability for ICs, boards, and systems, covering cross-domain, test economics, and product lifecycle challenges.

Topics of interest include, but not limited to

Test Methodologies & Technologies
• Adaptive Test in Practice
• ATE & Probe Card Design
• Built-In Self-Test (BIST)
• Boundary Scan & JTAG
• Design for Test (DFT) & DFM
• Mixed-Signal & Analog Test
• Memory Test & Repair
• MEMS Testing
• Power Issues in Test
• High-Speed I/O, RF & Jitter Test
• Test Compression & Optimization
• Test Generation & Validation

Industrial Case Study, System, & Application Specific Test
• 3D/2.5D & Advanced Packaging
• SoC/NoC Test
• 5G/6G Test
• Hardware Security & Trust
• Automotive Test
• IoT Test
• System Test
• Silicon case studies

Verification, Debug & Analysis
• Pre-Silicon/Post-Silicon Verification
• Silicon Debug & Field Monitoring
• Diagnosis & Defect Analysis
• Data-Driven Test & End-to-End Analytics
• Yield Analysis & Optimization
• Test-to-Design Feedback & Escape Analysis

Emerging Topics
• Reliability & Resilience
• Emerging Defect Mechanisms
• Protocol-Aware Test
• Optics & Photonics Test
• AI/Machine Learning in Test
• Quantum Device Testing
• KGD/KGS/KGP Economics
• New Technologies & Standards
Last updated by Dou Sun in 2025-12-29
Acceptance Ratio
YearSubmittedAcceptedAccepted(%)
20251644024.4%
20241553623.2%
20231623018.5%
20142506224.8%
20132504618.4%
20122506124.4%
Best Papers
YearBest Papers
2018Concept Recognition in Production Yield Data Analytics
2018Fast and accurate linearity test for DACs with various architectures using segmented models
2017A Single-Pin Test Control for Low-Pin-Count Big A, little d Devices
2017Safety Analysis for Integrated Circuits in the Context of Hybrid Systems
2016Power Supply Impedance Emulation to Eliminate Overkills and Underkills Due to the Impedance Difference Between ATE and Customer Board
2015A Structured Approach to Post Silicon Validation and Debug using Symbolic Quick Error Detect
2014Yield Optimization Using Advanced Statistical Correlation Methods
2013Test Time Reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations
2012Algorithm for Dramatically Improved Efficiency in ADC Linearity Test
2011Real-Time Testing Method for 16 Gbps 4-PAM Signal Interface
2010Adaptive Test Flow for Mixed-Signal RF Circuits Using Learned Information from Device Under Test
2010Lessons from At-Speed Scan Deployment on an Intel Itanium Microprocessor
2009Voltage Transient Detection and Induction for Debug and Test
2009A Robust Method for Identifying a Deterministic Jitter Model in a Total Jitter Distribution
2008Test Access Mechanism for Multiple Identical Cores
2008A Method to Generate a Very-Low-Distortion, High-Frequency Sine Waveform Using an AWG
2008Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data
2007On-Chip Timing Uncertainty Measurements on IBM Processors
2006Signature Based Diagnosis for Logic BIST
2005Structural Tests for Jitter Tolerance in SerDes Receivers
2004In Search of the Optimum Test Set-Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost
2004Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions
2004A New Probing Technique for High-Speed/High-Density Printed Circuit Boards
2003Elimination of Traditional Functional Testing of Interface Timings at Intel
2003Convolutional Compaction of Test Responses
2002Architecting Millisecond Test Solutions for Wireless Phone RFICs
2002Complete, Contactless I/O Testing – Reaching the Boundary in Minimizing Digital IC Testing Cost
2001Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data
2001Debug Methodology for the McKinley Processor
2000A Stand-alone Integrated Test Core for Time and Frequency Domain Measurements
2000Logic Mapping on a Microprocessor
1999Logic BIST for Large Industrial Designs: Real Issues and Case Studies
1999The Attack of the ‘Holey Shmoos’: A Case Study of Advanced DFD and Picosecond Imaging Circuit Analysis (PICA)
1999BIST for Phase-Locked Loops in Digital Applications
1999Current Ratios: A Self-Scaling Technique for Production IDDQ Testing
1998Failure Analysis of Timing and IDDQ-only Failures from the SEMATECH Test Methods Experiment
1998Defect Detection with Transient Current Testing and its Potential for Deep Sub-micron CMOS ICs
1998Probabilistic Mixed-Model Fault Diagnosis
1997Current Signatures: Application
1997Intrinsic Leakage in Low-Power Deep-Submicron CMOS ICs
1996Weak-Write Test Mode: an SRAM Cell Stability Design for Test Technique
1996Process-Aggravated Noise: New Validation and Test Problem
1996Early Capture for Boundary Scan Timing Measurments
1995Improved Boundary Scan Design
1995Improving DSP-Based Measurements with Spectral Interpolation
1994Defect Classes – An Overdue Paradigm for CMOS IC Testing
1994An Analog Multi-Tone Signal Generator for Built-In Self Test
1993Structure and Metrology for an Analog Testability Bus
1993A BIST Scheme for an SNR Test of a Sigma-Delta ADC
1992A Comparison of Defect Models for Fault Location with IDDQ Measurements
1992High-Performance Pin Electronics with GaAs, A Contradiction in Terms?
1992A Proposed Method of Accessing 1149.1 in a Backplane Environment
1991The Effect of Different Test Sets on Quality Level Prediction: When is 80% Better Than 90%?
1991Implementing 1149.1 on CMOS Microprocessors
1990CMOS Bridge Fault Detection
1990Frequency Enhancement of Digital Test Systems
1990Increased CMOS Stuck-at Fault Coverage with Reduced IDDQ Test Sets
1989Built-in Self-Test of the Macrolan Chip
1989A High-Performance, 10-Volt Integrated Pin Electronics Driver
1989A 250-MHz Shared-Resource VLSI Test System with High Pin-Count and Memory Test Capability
1988Statistical Delay Fault Coverage and Defect Level for Delay Faults
1988Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System
1988Membrane Probe Card Technology – The Future for High-Performance Wafer Test
1987Hierarchical Test Generation: Can AI Help?
1987A Generic Procedure for Evaluating VLSI Test System Timing Accuracy
1986Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials
1986Reliability and IC Electrical Properties of Gate Oxide Shorts
1986ISDN Device Testing Demands A New Level of Performance from Automatic Test Equipment
1985The Electrical Behavior of Gate-Oxide Short Defects
1984Random Testing for Stuck-at-Storage Cells in an Embedded Memory
1983HITEST – Intelligent Test Generation
1983New Techniques for High-Speed Analog Testing
1983Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems
1982Testability Measures – What do they tell us?
1981Automated Measurement of 12- to 16-bit Converters
1980Soft Error Testing
1980A New Approach to High-Speed Codec Testing
1980Testing for Bipolar Integrated Circuit Failures
1980Electron Beam Testing of Microprocessors
1979Design for Self-Verification: An Approach for Dealing with Testability Problems in VLSI-Based Designs
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