What is the submission deadline for ITC-Asia 2026?

The paper submission deadline for ITC-Asia 2026 (International Test Conference in Asia) is 2026-04-25 (extended).

Where is ITC-Asia 2026 held?

ITC-Asia 2026 is held in Ningbo, China.

When does ITC-Asia 2026 take place?

ITC-Asia 2026 takes place on 2026-08-19.

What is the ranking of ITC-Asia?

ITC-Asia is ranked CCF C. These are categorical rankings maintained by the respective bodies (China Computer Federation, ICORE Inc., and Brazilian CAPES).

Conference Information

ITC-Asia 2026: International Test Conference in Asia

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Submission Date:

2026-04-25 Extended

Notification Date:

2026-06-21

Conference Date:

2026-08-19

Location:

Ningbo, China

Years:

10 View past editions (1)

CCF: C Viewed: 17258 Tracked: 9 Attend: 0

Conference Partner Index (CP-I)

57.9 / 100

Ranked #656 of 5,645 conferences · Top 12%

Academic recognition (35%)		66
Submission selectivity (20%)	No data - scored at the neutral baseline of 50	—
Editions held (20%)		65
Community attention (10%)		37
Public record completeness (15%)		55

Inputs used: Listed as CCF C · Editions on record: 10 · Researchers following it here: 9 · Researchers who opened this page in the past 24 months: 6

Missing from the public record: Historical acceptance rates (+4.5) · Best-paper records (+2.3)
Organizers can add these from this page after claiming the conference; scores are recomputed nightly. How to raise this score

Confidence 80% - the share of the score backed by observed data rather than the neutral baseline. How this score is calculated · Browse the ranking · Algorithm version 1.1 · Computed 2026-08-31

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Call For Papers

ITC-Asia 2026 (International Test Conference in Asia) is a CCF C conference held in Ningbo, China on 2026-08-19. The paper submission deadline is 2026-04-25 (extended). Acceptance notifications are sent on 2026-06-21.

Topics of interest include (but are not limited to): - Hardware Oriented Security and Trust - AI Test and Test for AI - Autonomous Testing - Heterogeneous Testing - Hardware Oriented Security and Trust - Reliability and Testing for Emerging/Approximate/Quantum Computing - SiP, Chiplet, 2.5D and 3D IC Test- Design for Testability (DFT) - Built-In Self-Test (BIST) - Analog and Mixed-Signal Test / RF Test- High-Speed I/O Test - Automatic Test Pattern Generation (ATPG) - Fault Modeling and Simulation - System-on-Chip (SoC) Test - Memory Test, Diagnosis, and Repair - Fault Diagnosis and Failure Analysis - Safety and Test for Automotive ICs - Integrated System of Sensors - Test Economics- Yield Analysis and Learning - Board-Level Testing and Diagnosis

Last updated by Admin Agent on 2026-06-19

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Related Journals

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