Información de la conferencia

ITC-Asia 2026: International Test Conference in Asia

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ITC-Asia
Día de Entrega:
2026-04-25 Extended
Fecha de Notificación:
2026-06-21
Fecha de conferencia:
2026-08-19
Ubicación:
Ningbo, China
Ediciones:
CCF: C   Vistas: 16312   Seguidores: 9   Asistentes: 0

Solicitud de Artículos

ITC-Asia 2026 (International Test Conference in Asia) is a CCF C conference held in Ningbo, China on 2026-08-19. The paper submission deadline is 2026-04-25 (extended). Acceptance notifications are sent on 2026-06-21.

Topics of interest include (but are not limited to): - Hardware Oriented Security and Trust - AI Test and Test for AI - Autonomous Testing - Heterogeneous Testing - Hardware Oriented Security and Trust - Reliability and Testing for Emerging/Approximate/Quantum Computing - SiP, Chiplet, 2.5D and 3D IC Test- Design for Testability (DFT) - Built-In Self-Test (BIST) - Analog and Mixed-Signal Test / RF Test- High-Speed I/O Test - Automatic Test Pattern Generation (ATPG) - Fault Modeling and Simulation - System-on-Chip (SoC) Test - Memory Test, Diagnosis, and Repair - Fault Diagnosis and Failure Analysis - Safety and Test for Automotive ICs - Integrated System of Sensors - Test Economics- Yield Analysis and Learning - Board-Level Testing and Diagnosis
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