With the test technology facing its grand challenges to ensure the quality of ICs and electronic systems incorporating more and more sophisticated manufacturing processes and system integration technologies in various emerging applications such as Internet of Things, cloud computing, automotive electronics, etc., global proliferation and cooperation is increasingly more important. International Test Conference has been a flagship conference in test technology since 1970. With an attempt to stimulate more discussion and interaction between the academia and the industry around the globe, the 1st ITC-Asia was initiated in Taipei in 2017, and the 7th ITC-Asia will be held in Shimane Japan in 2023. Outstanding papers with extension will be invited to ITC 2023.

Topics of Interests include (but are not limited to) the following topics:

    Autonomous Testing
    Heterogeneous Testing
    Reliability and Testing for
    Emerging/Approximate/Quantum Computing
    AI test and Test for AI
    Hardware Oriented Security and Trust
    Design Validation and Debug
    ATE Design
    Analog and Mixed-Signal Test
    RF Test
    High-Speed I/O Test
    Fault Modeling and Simulation
    ATPG (Automatic Test Pattern Generation)
    Design for Testability
    Built-In Self-Test
    Delay Test
    System-on-Chip Test
    Test Compression
    Power-Aware and/or Thermal-Aware Test
    Memory Test, Diagnosis, and Repair
    Fault Diagnosis and Failure Analysis
    Yield Analysis and Learning
    Safety and Test for Automotive ICs
    Test for Internet of Things
    Test for Emerging Devices
    CPU/GPU Test
    MEMS/Sensor Test
    Online Test
    On-Chip Measurement
    SiP, Chiplet, 2.5D and 3D IC Test
    Interconnect Test
    Board-Level Testing and Diagnosis
    Test Standards
    Test Economics
    Reliability Issues
    Fault Tolerance
    Test for Reconfigurable Systems
    Software Test and Reliability
    Dependable Systems and Networks