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ITC-Asia 2026: International Test Conference in Asia

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ITC-Asia
투고 마감일:
2026-04-25 Extended
통보일:
2026-06-21
개최일:
2026-08-19
개최지:
Ningbo, China
개최 횟수:
CCF: C   조회: 16307   팔로우: 9   참가: 0

논문 모집

ITC-Asia 2026 (International Test Conference in Asia) is a CCF C conference held in Ningbo, China on 2026-08-19. The paper submission deadline is 2026-04-25 (extended). Acceptance notifications are sent on 2026-06-21.

Topics of interest include (but are not limited to): - Hardware Oriented Security and Trust - AI Test and Test for AI - Autonomous Testing - Heterogeneous Testing - Hardware Oriented Security and Trust - Reliability and Testing for Emerging/Approximate/Quantum Computing - SiP, Chiplet, 2.5D and 3D IC Test- Design for Testability (DFT) - Built-In Self-Test (BIST) - Analog and Mixed-Signal Test / RF Test- High-Speed I/O Test - Automatic Test Pattern Generation (ATPG) - Fault Modeling and Simulation - System-on-Chip (SoC) Test - Memory Test, Diagnosis, and Repair - Fault Diagnosis and Failure Analysis - Safety and Test for Automotive ICs - Integrated System of Sensors - Test Economics- Yield Analysis and Learning - Board-Level Testing and Diagnosis
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관련 학회

관련 저널

CCF정식 명칭영향력 지수출판사ISSN
IEEE Design & Test1.9IEEE2168-2356
CKnowledge-Based Systems7.2Elsevier0950-7051
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
CIEEE Transactions on Industrial Informatics11.7IEEE1551-3203
CIEEE Internet of Things Journal8.9IEEE2327-4662
CEngineering Applications of Artificial Intelligence9.0Elsevier0952-1976
CExpert Systems with Applications7.5Elsevier0957-4174
CIEEE Transactions on Big Data5.7IEEE2332-7790

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