Basic Information
Name: Jian Hu
Institution: National University of Defense Technology
Registration: 2019-06-24
Score: 456
Tracked Conferences
| Short | Full Name | Submission | Conference |
|---|---|---|---|
| ETS | European Test Symposium | 2020-12-17 | 2021-05-24 |
| ISCAS | International Symposium on Circuits and Systems | 2020-10-23 | 2021-05-23 |
| ICCC'' | IEEE International Conference on Computer and Communications | 2020-10-20 | 2020-12-11 |
| ICST | International Conference on Software Testing, Verification and Validation | 2020-10-05 | 2021-04-12 |
| ACAI | International Conference on Algorithms, Computing and Artificial Intelligence | 2020-08-30 | 2020-12-24 |
| AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-11-20 |
| CSAE | International Conference on Computer Science and Application Engineering | 2020-08-01 | 2020-10-20 |
| ASP-DAC | Asia and South Pacific Design Automation Conference | 2020-07-26 | 2021-01-18 |
| ICISCA | International Conference of Information Science and Computer Applications | 2020-07-10 | 2020-09-27 |
| FMCAD | Formal Methods in Computer-Aided Design | 2020-05-09 | 2020-09-21 |
Attend Conferences
| CCF | CORE | QUALIS | Short | Full Name | Conference | Location |
|---|---|---|---|---|---|---|
| No results found. | ||||||
| Full Name | Conference | Location |
|---|---|---|
| No results found. | ||
Tracked Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | 1571-0661 | ||
| c | Integration, the VLSI Journal | 1.150 | Elsevier | 0167-9260 |
| c | Future Generation Computer Systems | 5.768 | Elsevier | 0167-739X |
| c | Journal of Electronic Testing: Theory and Applications | 0.554 | Springer | 0923-8174 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | |
| Integration, the VLSI Journal | 1.150 | Elsevier |
| Future Generation Computer Systems | 5.768 | Elsevier |
| Journal of Electronic Testing: Theory and Applications | 0.554 | Springer |
Followed Researchers
| Name | Institution | Registration | Score |
|---|---|---|---|
| No results found. | |||
| Name | Institution | Score |
|---|---|---|
| No results found. | ||
Tracked Jobs
| Job Title | Employer | Job Location |
|---|---|---|
| No results found. | ||
| Job Title | Employer | Job Location |
|---|---|---|
| No results found. | ||
Viewed Conferences
Viewed Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| International Journal of Electronic Governance | Inderscience | 1742-7509 | ||
| Journal of Computer Science Engineering | 2.562 | IJRDO | 2456-1843 | |
| c | Journal of Electronic Testing: Theory and Applications | 0.554 | Springer | 0923-8174 |
| Journal of Electrical and Computer Engineering | Hindawi | 2090-0147 | ||
| IEEE Access | 4.098 | IEEE | 2169-3536 | |
| Journal of Electronic Testing | 0.454 | Springer | 0923-8174 | |
| c | Integration, the VLSI Journal | 1.150 | Elsevier | 0167-9260 |
| Electronic Notes in Theoretical Computer Science | Elsevier | 1571-0661 | ||
| c | Future Generation Computer Systems | 5.768 | Elsevier | 0167-739X |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| International Journal of Electronic Governance | Inderscience | |
| Journal of Computer Science Engineering | 2.562 | IJRDO |
| Journal of Electronic Testing: Theory and Applications | 0.554 | Springer |
| Journal of Electrical and Computer Engineering | Hindawi | |
| IEEE Access | 4.098 | IEEE |
| Journal of Electronic Testing | 0.454 | Springer |
| Integration, the VLSI Journal | 1.150 | Elsevier |
| Electronic Notes in Theoretical Computer Science | Elsevier | |
| Future Generation Computer Systems | 5.768 | Elsevier |