Conference Information

ICST 2026: International Conference on Software Testing, Verification and Validation

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Submission Date:
2025-12-15
Notification Date:
2026-02-20
Conference Date:
2026-05-18
Location:
Daejeon, South Korea
Years:
19
CCF: c   CORE: a   QUALIS: b2   Viewed: 45915   Tracked: 79   Attend: 15

Call For Papers

ICST 2026 (International Conference on Software Testing, Verification and Validation) is a CCF C / CORE A / QUALIS B2 conference held in Daejeon, South Korea on 2026-05-18. The paper submission deadline is 2025-12-15. Acceptance notifications are sent on 2026-02-20.

ICST 2026 invites high-quality submissions in all software testing, verification, and validation areas. Topics of interest include, but are not limited to, the following: AI-assisted software testing Automated test generation Formal verification Manual and social aspects of the software testing process Replications, empirical studies, case studies, experience reports Software reliability Static and dynamic analysis Test automation Test-driven development and Agile testing Testability, test design, and adequacy criteria Testing AI-based systems Testing and development processes Testing, debugging, and repair tools Testing education Testing in specific domains, such as mobile, web, embedded/cyber-physical systems, concurrent, distributed, cloud, GUI, context-aware, IoT, real-time systems, video games, augmented/virtual reality applications Testing of non-functional properties such as security, accessibility, and performance Theory of software testing Validation and user acceptance techniques Papers for the research track should present novel and original work that advances the state-of-the-art. Case studies, replication studies, and empirical research papers are also welcome. Papers with a strong industrial/practical component and focus more on impact than (technical) novelty are encouraged to consider the industry track instead.
Last updated by Dou Sun in

Acceptance Ratio

Average acceptance rate: 26.2% over 3 years (2008–2012).

YearSubmittedAcceptedAccepted(%)
20121453926.9%
20101544126.6%
20081473725.2%

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Related Journals

CCFFull NameImpact FactorPublisherISSN
Software Testing Verification and Reliability1.2Wiley-Blackwell0960-0833
Journal of Electronic Testing1.3Springer0923-8174
bSoftware Testing, Verification and Reliability1.2John Wiley & Sons, Ltd1099-1689
cKnowledge-Based Systems7.2Elsevier0950-7051
cFuture Generation Computer Systems6.1Elsevier0167-739X
cNeurocomputing6.5Elsevier0925-2312
cPattern Recognition Letters3.9Elsevier0167-8655
cIEEE Transactions on Industrial Informatics11.7IEEE1551-3203
cIEEE Internet of Things Journal8.9IEEE2327-4662
cEngineering Applications of Artificial Intelligence8.0Elsevier0952-1976

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