Conference Information
VTS 2025: VLSI Test Symposium
https://tttc-vts.org/public_html/new/2025/Submission Date: |
2024-11-01 |
Notification Date: |
2025-01-31 |
Conference Date: |
2025-04-28 |
Location: |
Tempe, Arizona, USA |
Years: |
43 |
CCF: c QUALIS: a2 Viewed: 21227 Tracked: 19 Attend: 1
Call For Papers
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability, and security of microelectronic circuits and systems. The symposium will take place on April 28-30 2025, in Tempe, AZ, USA. The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions. You are invited to participate and submit your contributions to VTS’25. The areas of interest include (but are not limited to) the following topics: VTS Topics Generative AI Applications in Test and Security Silicon Lifecycle Management Silent Data Corruption Test-Enabled Digital Twin Analog – Mixed-Signal – RF Test ATPG & Compression Automotive Test & Safety Built-In Self-Test (BIST) Functional safety Digital twin enabled test and security High BW Test through High-Speed Interfaces Testing for extreme environments Test og Non-Si & Compound Circuits Test and Security of Quantum Circuits Test and Security of Photonic Circuits Test and Security of Emerging Memory Technologies Functional Debug through Scan Fault Modeling and Simulation Low-Power IC Test Machine Learning for Test & Security Microsystems/MEMS/Sensors Test Memory Test and Repair Test for 3D & Heterogenous Integration Yield Optimization On-Line Test & Error Correction Power & Thermal Issues in Test System-on-Chip (SOC) Test Test & Reliability of Biomedical Devices Test & Reliability of High-Speed I/O Test & Security of Machine Learning Hardware Test Standards FPGA Test Defect-Based Test Defect & Fault Tolerance Delay & Performance Test Design for Testability Post-silicon Validation & Debug Hardware Security Embedded System & Board Test
Last updated by Dou Sun in 2024-09-16
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