Basic Information
Name: Liming Zhang
Institution: Jilin University
Registration: 2019-05-07
Score: 229
Tracked Conferences
CCFCOREQUALISShortFull NameSubmissionNotificationConference
bba1ITCInternational Test Conference2020-07-242020-07-242017-10-31
aa*a1FSEACM SIGSOFT Symposium on the Foundations of Software Engineering2020-03-052020-05-212020-11-13
aa*a1IJCAIInternational Joint Conference on Artificial Intelligence2020-01-152020-04-192020-07-11
cb1GLSVLSIGreat Lakes Symposium on VLSI2019-12-172020-02-182020-05-27
cb2ETSEuropean Test Symposium2019-12-092020-02-132020-05-25
aaa1DACDesign Automation Conference2019-11-20 2020-07-19
baa2ECAIEuropean Conference on Artificial Intelligence2019-11-152020-01-152020-06-08
ca1ISCASInternational Symposium on Circuits and Systems2019-11-032019-12-292020-05-17
ca2VTSVLSI Test Symposium2019-10-182019-12-102020-04-05
bba1DATEDesign, Automation and Test in Europe2019-09-082019-11-072020-03-09
ShortFull NameSubmissionConference
ITCInternational Test Conference2020-07-242017-10-31
FSEACM SIGSOFT Symposium on the Foundations of Software Engineering2020-03-052020-11-13
IJCAIInternational Joint Conference on Artificial Intelligence2020-01-152020-07-11
GLSVLSIGreat Lakes Symposium on VLSI2019-12-172020-05-27
ETSEuropean Test Symposium2019-12-092020-05-25
DACDesign Automation Conference2019-11-202020-07-19
ECAIEuropean Conference on Artificial Intelligence2019-11-152020-06-08
ISCASInternational Symposium on Circuits and Systems2019-11-032020-05-17
VTSVLSI Test Symposium2019-10-182020-04-05
DATEDesign, Automation and Test in Europe2019-09-082020-03-09
Attend Conferences
CCFCOREQUALISShortFull NameConferenceLocation
baa1ICCADInternational Conference on Computer-Aided Design2019-11-04Westminster, Colorado, USA
Full NameConferenceLocation
International Conference on Computer-Aided Design2019-11-04Westminster, Colorado, USA
Tracked Journals
CCFFull NameImpact FactorPublisherISSN
cJournal of Electronic Testing: Theory and Applications0.554Springer0923-8174
Full NameImpact FactorPublisher
Journal of Electronic Testing: Theory and Applications0.554Springer
Followed Researchers
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