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ATS 2026: Asian Test Symposium

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ATS
Día de Entrega:
2026-06-06
Fecha de Notificación:
2026-09-14
Fecha de conferencia:
2026-12-01
Ubicación:
Kaohsiung City, Taiwan
Ediciones:
35
CCF: C   Vistas: 34207   Seguidores: 18   Asistentes: 1

Solicitud de Artículos

ATS 2026 (Asian Test Symposium) is a CCF C conference held in Kaohsiung City, Taiwan on 2026-12-01. The paper submission deadline is 2026-06-06. Acceptance notifications are sent on 2026-09-14.

Topics — Original papers on, but not limited to, the following areas are invited: AI test and Test for AI Analog/Mixed-Signal Test ATE Design Automatic Test Pattern Generation (ATPG) Autonomous Testing Board-Level Testing and Diagnosis Boundary Scan Test Built-In Self-Test (BIST) CPU/GPU Test Connectivity Testing Defect-Based Test Delay and Performance Test Dependability and Functional Safety Design Verification, Validation, and Debug Design for Testability (DFT) Diagnosis and Silicon Debug Fault Diagnosis and Failure Analysis Fault Modeling and Simulation Fault Tolerance Hardware Oriented Security and Trust High-Speed I/O Test Heterogeneous Testing Low-Power IC Test Machine Learning in Test Memory Test, Diagnosis, and Repair Multi-/Many-core Processor Test Online Test On-Chip Measurement Power/Thermal/Reliability Issues in Test Reconfigurable System Test Reliability and Testing for Emerging/Approximate/Quantum Computing RF Test Safety and Test for Automotive ICs Self-Repair SiP, Chiplet, 2.5D and 3D IC Test Software Test and Reliability Standards in Test System-on-Chip Test Test Compression Test Economics Test Quality Test Synthesis Test for Biomedical Circuits and Systems Test for MEMS and Microfluidic Systems Test for Nanoscale Devices and Emerging Technologies Test for Reversible and Quantum Circuits Test for Sensors and IoT Yield Analysis, Learning, and Enhancement
Última actualización por Dou Sun el

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