会议信息

VTS 2026: VLSI Test Symposium

请登录查看会议网址
免费注册：查看官网链接、跟踪截稿日期，并接收邮件提醒。
登录 注册
嵌入截止倒计时徽章
VTS
截稿日期:
2025-11-03
通知日期:
2026-01-31
会议日期:
2026-04-27
会议地点:
Napa, California, USA
届数:
44
CCF: C   QUALIS: A2   浏览: 35752   关注: 21   参加: 2

征稿

VTS 2026 (VLSI Test Symposium) is a CCF C / QUALIS A2 conference held in Napa, California, USA on 2026-04-27. The paper submission deadline is 2025-11-03. Acceptance notifications are sent on 2026-01-31.

The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions. You are invited to participate and submit your contributions to VTS’26. The areas of interest include (but are not limited to) the following topics: VTS Topics Generative AI Applications in Test and Security Silicon Lifecycle Management Silent Data Corruption Test-Enabled Digital Twin Analog – Mixed-Signal – RF Test ATPG and Compression Automotive Test and Safety Built-In Self-Test (BIST) Functional safety Digital twin-enabled test and security High BW Test through High-Speed Interfaces Testing for extreme environments Test og Non-Si and Compound Circuits Test and Security of Quantum Circuits Test and Security of Photonic Circuits Test and Security of Emerging Memory Technologies Functional Debug through Scan Fault Modeling and Simulation Low-Power IC Test Machine Learning for Test and Security Microsystems/MEMS/Sensors Test Memory Test and Repair Test for 3D and Heterogenous Integration Yield Optimization Online Test and Error Correction Power and Thermal Issues in Test System-on-Chip (SOC) Test Test and Reliability of Biomedical Devices Test and Reliability of High-Speed I/O Test and Security of Machine Learning Hardware Test Standards FPGA Test Defect-Based Test Defect and Fault Tolerance Delay and Performance Test Design for Testability Post-silicon Validation and Debug Hardware Security Embedded System and Board Test
由 Dou Sun 最后更新于

相关会议

CCFICORE简称全称截稿日期通知日期会议日期
VLSIInternational Conference on VLSI2026-08-162026-10-242026-11-27
VDATInternational Symposium on VLSI Design and Test2026-04-302026-06-302026-08-20
CICCInternational Conference on Communications2026-10-022027-01-152027-05-30
CBIJCNNInternational Joint Conference on Neural Networks2027-01-312027-03-152027-06-14
CBTrustComInternational Conference on Trust, Security and Privacy in Computing and Communications2025-08-012025-10-012025-11-14
CBICONIPInternational Conference on Neural Information Processing2026-05-102026-07-152026-11-23
CCHPCCInternational Conference on High Performance Computing and Communications2026-07-152026-09-102026-10-29
CAGECCOGenetic and Evolutionary Computation Conference2027-07-12
CBGlobecomIEEE Global Communications Conference2026-04-012026-08-012026-12-07
CBICPRInternational Conference on Pattern Recognition2026-01-102026-03-312026-08-17

相关期刊

CCF全称影响因子出版商ISSN
VLSI DesignHindawi1065-514X
IEEE Design & Test1.9IEEE2168-2356
CKnowledge-Based Systems7.2Elsevier0950-7051
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
CIEEE Transactions on Industrial Informatics11.7IEEE1551-3203
CIEEE Internet of Things Journal8.9IEEE2327-4662
CEngineering Applications of Artificial Intelligence9.0Elsevier0952-1976
CExpert Systems with Applications7.5Elsevier0957-4174

评论 0

暂无评论。

请登录后发表评论