You are invited to participate and submit your contributions to VTS’24. The areas of interest include (but are not limited to) the following topics:

VTS Topics

    Analog – Mixed-Signal – RF Test
    ATPG & Compression
    Silicon Debug
    Automotive Test & Safety
    Built-In Self-Test (BIST)
    Defect & Current Based Test
    Defect & Fault Tolerance
    Delay & Performance Test
    Design for Testability – Yield or Reliability
    Pre-silicon Design Verification & Validation
    Post-silicon Validation
    Hardware Security
    Embedded System & Board Test
    Embedded Test Methods
    Emerging Technologies Test and Reliability
    Fault Modeling and Simulation
    Low-Power IC Test
    Machine Learning in Test – Yield and Reliability
    Microsystems/MEMS/Sensors Test
    Memory Test and Repair
    2.5D – 3D & SiP Test
    Yield Optimization
    On-Line Test & Error Correction
    Power & Thermal Issues in Test
    System-on-Chip (SOC) Test
    Test & Reliability of Biomedical Devices
    Test & Reliability of High-Speed I/O
    Test & Reliability of Machine Learning Systems
    Test Quality & Reliability
    Test Standards & Economics
    Test Resource Partitioning
    Transient & Soft Errors
    FPGA Test