征稿
IEEE Design & Test is an academic journal published by IEEE. (ISSN 2168-2356, impact factor 1.9).
由 Dou Sun 最后更新于
相关期刊
| CCF | 全称 | 影响因子 | 出版商 | ISSN |
|---|---|---|---|---|
| IEEE Computer | 2.3 | IEEE | 0018-9162 | |
| IEEE Software | 3.3 | IEEE | 0740-7459 | |
| IEEE Intelligent Systems | 6.1 | IEEE | 1541-1672 | |
| IEEE Network | 6.3 | IEEE | 0890-8044 | |
| IEEE MultiMedia | 3.3 | IEEE | 1070-986X | |
| IEEE Wireless Communications | 11.5 | IEEE | 1536-1284 | |
| IEEE Security & Privacy | 3.0 | IEEE | 1540-7993 | |
| IEEE Computer Graphics and Applications | 1.4 | IEEE | 0272-1716 | |
| IEEE Transactions on Power Systems | 7.2 | IEEE | 0885-8950 | |
| IEEE Transactions on Control Systems Technology | 3.9 | IEEE | 1063-6536 |
相关会议
| CCF | ICORE | 简称 | 全称 | 截稿日期 | 通知日期 | 会议日期 |
|---|---|---|---|---|---|---|
| IDT | IEEE International Design & Test Symposium | 2015-10-11 | 2015-10-30 | 2015-12-14 | ||
| DTS | IEEE international conference on Design & Test of integrated micro & nano-Systems | 2019-02-04 | 2019-03-12 | 2019-04-28 | ||
| IEEE S&B | IEEE Security & Privacy on the Blockchain Workshop | 2021-05-21 | 2021-06-15 | 2021-09-07 | ||
| VDAT | International Symposium on VLSI Design and Test | 2026-04-30 | 2026-06-30 | 2026-08-20 | ||
| MDTS | Microelectronics Design and Test Symposium | 2021-03-30 | 2021-04-20 | 2021-05-18 | ||
| B | A | DATE | Design, Automation and Test in Europe | 2026-09-07 | 2026-11-10 | 2027-03-22 |
| C | AST | ACM/IEEE International Conference on Automation of Software Test | 2025-11-09 | 2026-01-05 | 2026-04-12 | |
| C | B | IEEE CLOUD | IEEE International Conference on Cloud Computing | 2023-03-25 | 2023-05-08 | 2023-07-02 |
| B | A | ITC | International Test Conference | 2026-03-20 | 2026-06-19 | 2026-10-11 |
| HLDVT | International High-Level Design, Validation, and Test Workshop | 2016-07-24 | 2016-08-15 | 2016-10-07 |
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