Conference Information
DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems
http://dts-conf.org/
Submission Date:
2019-02-04 Extended
Notification Date:
2019-03-12
Conference Date:
2019-04-28
Location:
Gammarth, Tunisia
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Conference Location
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Call For Papers
 Systems Design & Technology (SDT) :

    Analog, digital, mixed, and RF circuits design
    SoC, MPSoC, NoC, SIP, and NIP design
    Embedded electronics and System architecture
    MEMS, NEMS and MOEMS systems design
    Low-power electronics and systems design
    Sensory Systems Design
    Wireless communication systems design
    Opto-electronic System Design
    Biomedical Circuit & Systems
    Bio-engineering & Bio-chip design
    Linear & Non-Linear Circuits
    Power electronics and systems design
    Hardware co-design & FPGA design
    VLSI systems circuit and design
    DSPs and multiprocessor systems
    Embedded systems for Deep Learning
    Control Systems & Mechatronics
    Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs
    Algorithms, methods and tools for signal processing and image processing
    Algorithms, methods and tools for information security and cryptography
    Artificial Intelligence systems
    Electronic systems for energy harvesting applications
    GPS based engineering systems
    Process technologies, CMOS, BiCMOS, GaAs
    Microwave Systems & Integrated antenna
    3D integration design and analysis
    ICs packaging

Systems Testing & Reliability (STR) :

    Analog, digital, mixed, and RF circuits testing
    SoC, MPSoC, NoC, SIP, and NIP test
    On-line Testing and fault Tolerance
    Defect and Fault Modeling
    MEMS, NEMS and MOEMS Testing
    3D testing
    Delay testing
    DFT, BIST and BISR
    Fault Simulation, ATPG
    Yield Optimization
    Memory & FPGA Test and Repair
    Automotive reliability and test
    Reliability failures and modeling
    Electronic System Reliability
    Test and Security Issues
    ATE issues
    Alternatives test strategies

Nano Electronic Systems (NES) :

    Nanostructured / nanoporous Materials and devices
    Nano-circuits and Nano-architectures
    Nano-sensors and Actuators
    Nanorobotics and Nano-manipulation
    Modeling and Simulation at the Nanoscale
    Carbon Nanostructures and devices
    Microfluidics and Nanofluidics Systems
    3D printing systems
    Polymer Nanotechnology
    Nanoscale Materials Characterization
    Sensors based on emerging devices
    Renewable Energy Technologies
    Smart Grid
    Measurement of health risk
    Aerospace and Vehicle Manufacturers

VLSI IoT Devices (IoT) :

    Ultra-low power VLSI design for IoT
    System on Chip for IoTs
    IoT Application oriented Technologies
    IoT communication systems
    Real-time IoT systems
    RFID systems
    IoT Services and Applications
    IoT nodes architectures
    Sensors and Actuators for IoT
    Power and Energy systems design for IoT nodes
    Connectivity for IoT
    Computing Platforms for IoT
    Data Acquisition, Storage and Management for IoT
    Security and Privacy Enhancing Technologies for IoT devices
    IoT System Interfaces
    Reliability of IoT VLSI
Last updated by Dou Sun in 2019-01-22
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