Conference Information

DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems

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Submission Date:
2019-02-04 Extended
Notification Date:
2019-03-12
Conference Date:
2019-04-28
Location:
Gammarth, Tunisia
Viewed: 18519   Tracked: 0   Attend: 1

Conference Partner Index (CP-I)

42.1 / 100
Ranked #4,137 of 5,682 conferences · Top 73%
Limited evidence: this conference is not listed in CCF / ICORE / QUALIS and has no acceptance-rate data on file, so most of the score falls back to the neutral baseline.
Academic recognition (35%) No data - scored at the neutral baseline of 50 —
Submission selectivity (20%) No data - scored at the neutral baseline of 50 —
Editions held (20%) No data - scored at the neutral baseline of 50 —
Community attention (10%)
8
Public record completeness (15%)
25

Inputs used: Researchers who opened this page in the past 24 months: 2

Missing from the public record: Historical acceptance rates (+4.5) · Past editions (+3.0) · Best-paper records (+2.3)
Organizers can add these from this page after claiming the conference; scores are recomputed nightly. How to raise this score

Confidence 25% - the share of the score backed by observed data rather than the neutral baseline. How this score is calculated · Browse the ranking · Algorithm version 1.1 · Computed 2026-09-17

Call For Papers

DTS 2019 (IEEE international conference on Design & Test of integrated micro & nano-Systems) is an academic conference held in Gammarth, Tunisia on 2019-04-28. The paper submission deadline is 2019-02-04 (extended). Acceptance notifications are sent on 2019-03-12.

Systems Design & Technology (SDT) : Analog, digital, mixed, and RF circuits design SoC, MPSoC, NoC, SIP, and NIP design Embedded electronics and System architecture MEMS, NEMS and MOEMS systems design Low-power electronics and systems design Sensory Systems Design Wireless communication systems design Opto-electronic System Design Biomedical Circuit & Systems Bio-engineering & Bio-chip design Linear & Non-Linear Circuits Power electronics and systems design Hardware co-design & FPGA design VLSI systems circuit and design DSPs and multiprocessor systems Embedded systems for Deep Learning Control Systems & Mechatronics Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs Algorithms, methods and tools for signal processing and image processing Algorithms, methods and tools for information security and cryptography Artificial Intelligence systems Electronic systems for energy harvesting applications GPS based engineering systems Process technologies, CMOS, BiCMOS, GaAs Microwave Systems & Integrated antenna 3D integration design and analysis ICs packaging Systems Testing & Reliability (STR) : Analog, digital, mixed, and RF circuits testing SoC, MPSoC, NoC, SIP, and NIP test On-line Testing and fault Tolerance Defect and Fault Modeling MEMS, NEMS and MOEMS Testing 3D testing Delay testing DFT, BIST and BISR Fault Simulation, ATPG Yield Optimization Memory & FPGA Test and Repair Automotive reliability and test Reliability failures and modeling Electronic System Reliability Test and Security Issues ATE issues Alternatives test strategies Nano Electronic Systems (NES) : Nanostructured / nanoporous Materials and devices Nano-circuits and Nano-architectures Nano-sensors and Actuators Nanorobotics and Nano-manipulation Modeling and Simulation at the Nanoscale Carbon Nanostructures and devices Microfluidics and Nanofluidics Systems 3D printing systems Polymer Nanotechnology Nanoscale Materials Characterization Sensors based on emerging devices Renewable Energy Technologies Smart Grid Measurement of health risk Aerospace and Vehicle Manufacturers VLSI IoT Devices (IoT) : Ultra-low power VLSI design for IoT System on Chip for IoTs IoT Application oriented Technologies IoT communication systems Real-time IoT systems RFID systems IoT Services and Applications IoT nodes architectures Sensors and Actuators for IoT Power and Energy systems design for IoT nodes Connectivity for IoT Computing Platforms for IoT Data Acquisition, Storage and Management for IoT Security and Privacy Enhancing Technologies for IoT devices IoT System Interfaces Reliability of IoT VLSI
Last updated by Dou Sun on

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