会议信息

DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems

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截稿日期:
2019-02-04 Extended
通知日期:
2019-03-12
会议日期:
2019-04-28
会议地点:
Gammarth, Tunisia
浏览: 18523   关注: 0   参加: 1

会伴指数 (CP-I)

42.1 / 100
全站第 4,137 名 / 共 5,682 个会议 · 前 73%
证据有限：这个会议不在 CCF / ICORE / QUALIS 任何一份榜单里，也没有录用率数据，因此分数的大部分回落到了中性基准。
学术认可 (35%) 无数据 —— 按中性基准 50 分计入 —
投稿选择性 (20%) 无数据 —— 按中性基准 50 分计入 —
会议传承 (20%) 无数据 —— 按中性基准 50 分计入 —
社区关注 (10%)
8
资料公开度 (15%)
25

用到的输入: 过去 24 个月打开过本页的研究者：2 人

公开资料里还缺: 历年录用率 (+4.5) · 历届信息 (+3.0) · 最佳论文记录 (+2.3)
主办方认领本会议后，可直接在这一页补上；分数每晚重算。如何提升这个分数

置信度 25% —— 分数中有多大比例来自实际观测到的数据，而不是中性基准。 这个分数是怎么算出来的 · 查看完整榜单 · 算法版本 1.1 · 算于 2026-09-17

征稿

DTS 2019 (IEEE international conference on Design & Test of integrated micro & nano-Systems) is an academic conference held in Gammarth, Tunisia on 2019-04-28. The paper submission deadline is 2019-02-04 (extended). Acceptance notifications are sent on 2019-03-12.

Systems Design & Technology (SDT) : Analog, digital, mixed, and RF circuits design SoC, MPSoC, NoC, SIP, and NIP design Embedded electronics and System architecture MEMS, NEMS and MOEMS systems design Low-power electronics and systems design Sensory Systems Design Wireless communication systems design Opto-electronic System Design Biomedical Circuit & Systems Bio-engineering & Bio-chip design Linear & Non-Linear Circuits Power electronics and systems design Hardware co-design & FPGA design VLSI systems circuit and design DSPs and multiprocessor systems Embedded systems for Deep Learning Control Systems & Mechatronics Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs Algorithms, methods and tools for signal processing and image processing Algorithms, methods and tools for information security and cryptography Artificial Intelligence systems Electronic systems for energy harvesting applications GPS based engineering systems Process technologies, CMOS, BiCMOS, GaAs Microwave Systems & Integrated antenna 3D integration design and analysis ICs packaging Systems Testing & Reliability (STR) : Analog, digital, mixed, and RF circuits testing SoC, MPSoC, NoC, SIP, and NIP test On-line Testing and fault Tolerance Defect and Fault Modeling MEMS, NEMS and MOEMS Testing 3D testing Delay testing DFT, BIST and BISR Fault Simulation, ATPG Yield Optimization Memory & FPGA Test and Repair Automotive reliability and test Reliability failures and modeling Electronic System Reliability Test and Security Issues ATE issues Alternatives test strategies Nano Electronic Systems (NES) : Nanostructured / nanoporous Materials and devices Nano-circuits and Nano-architectures Nano-sensors and Actuators Nanorobotics and Nano-manipulation Modeling and Simulation at the Nanoscale Carbon Nanostructures and devices Microfluidics and Nanofluidics Systems 3D printing systems Polymer Nanotechnology Nanoscale Materials Characterization Sensors based on emerging devices Renewable Energy Technologies Smart Grid Measurement of health risk Aerospace and Vehicle Manufacturers VLSI IoT Devices (IoT) : Ultra-low power VLSI design for IoT System on Chip for IoTs IoT Application oriented Technologies IoT communication systems Real-time IoT systems RFID systems IoT Services and Applications IoT nodes architectures Sensors and Actuators for IoT Power and Energy systems design for IoT nodes Connectivity for IoT Computing Platforms for IoT Data Acquisition, Storage and Management for IoT Security and Privacy Enhancing Technologies for IoT devices IoT System Interfaces Reliability of IoT VLSI
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