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DATE 2027: Design, Automation and Test in Europe

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DATE
Día de Entrega:
2026-09-07 Faltan 44 días
Fecha de Notificación:
2026-11-10
Fecha de conferencia:
2027-03-22
Ubicación:
Dresden, Germany
Ediciones:
CCF: B   ICORE: A   QUALIS: A1   Vistas: 963551   Seguidores: 152   Asistentes: 25

Solicitud de Artículos

DATE 2027 (Design, Automation and Test in Europe) is a CCF B / ICORE A / QUALIS A1 conference held in Dresden, Germany on 2027-03-22. The paper submission deadline is 2026-09-07. Acceptance notifications are sent on 2026-11-10.

Areas of Interest Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences. Topics of interest include, but are not restricted to: • System-level design methodologies and high-level synthesis • System simulation and validation • Formal methods and verification • Design and test for analogue and mixed-signal circuits and systems, and MEMS • Design and test of hardware security primitives • Design and test of secure systems • Network on chip and on-chip communication • Architectural and microarchitectural design • Low-power, energy-efficient and thermal-aware design • Approximate computing • Reconfigurable systems • Logical analysis and design • Physical analysis and design • Emerging design technologies for future computing • Emerging design technologies for future memories • Design Automation for Quantum Computing • Power-efficiency and Smart Energy Systems for Sustainable Computing • Smart Society and Digital Wellness • Secure Systems, Circuits and Architectures • Autonomous Systems and Smart Industry • Applications of Artificial Intelligence Systems • Applications of Emerging Technologies • Modelling and mitigation of defects, faults, variability, and reliability • Test generation, test architectures, design for test, and diagnosis • Dependability and system-level test • Embedded software architecture, compilers and tool chains • Real-time, dependable and privacy-enhanced systems • Machine learning solutions for embedded and cyberphysical systems • Design methodologies for machine learning architectures • Design modelling and verification for embedded and cyber-physical systems
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Tasa de aceptación

Tasa de aceptación media: 26.7% en 2 años (2005–2006).

AñoEnviadosAceptadosAceptados(%)
200683426732%
200582517621.3%

Los Mejores Artículos

AñoLos Mejores Artículos
2020Statistical Time-based Intrusion Detection in Embedded Systems
2020DEFCON: Generating and Detecting Failure-prone Instruction Sequences via Stochastic Search
2020A Flexible and Scalable NTT Hardware: Applications from Homomorphically Encrypted Deep Learning to Post-Quantum Cryptography
2020Impact of Magnetic Coupling and Density on STT-MRAM Performance
2019When Capacitors Attack: Formal Method Driven Design and Detection of Charge-Domain Trojans
2019Enhancing Reliability of STT-MRAM Caches by Eliminating Read Disturbance Accumulation
2019Error-Shielded Register Renaming Subsystem for a Dynamically Scheduled Out-of-Order Core
2019Data Subsetting: A Data-Centric Approach to Approximate Computing
2018Efficient Verification Of Multi-Property Designs (The Benefit Of Wrong Assumptions)
2018MATIC: Learning Around Errors for Efficient Low-Voltage Neural Network Accelerators
2018Low-Cost High-Accuracy Variation Characterization for Nanoscale IC Technologies via Novel Learning-based Techniques
2018Buffer-aware bounds to multi-point progressive blocking in priority-preemptive NoCs
2017Fast and Waveform-Accurate Hazard-Aware SAT-Based TSOF ATPG
2017CoSyn: Efficient Single-Cell Analysis Using a Hybrid Microfluidic Platform
2017MoDNN: Local Distributed Mobile Computing System for Deep Neural Network
2017Automatic Place-and-Route of Emerging LED-Driven Wires within a Monolithically-Integrated CMOS+III-V Process
2016UTILIZING MACROMODELS IN FLOATING RANDOM WALK BASED CAPACITANCE
2016OTEM: OPTIMIZED THERMAL AND ENERGY MANAGEMENT FOR HYBRID ELECTRICAL ENERGY STORAGE IN ELECTRIC VEHICLES
2016MODELING FABRICATION NON-UNIFORMITY IN CHIP-SCALE SILICON PHOTONIC INTERCONNECTS
2016PROBABILISTIC WCET ESTIMATION IN PRESENCE OF HARDWARE FOR MITIGATING THE IMPACT OF PERMANENT FAULTS
2015HARDWARE TROJAN DETECTION FOR GATE-LEVEL ICS USING SIGNAL CORRELATION BASED CLUSTERING
2015DIGITAL CIRCUITS RELIABILITY WITH IN-SITU MONITORS IN 28NM FULLY DEPLETED SOI
2015PHASE-NOC: TDM SCHEDULING AT THE VIRTUAL-CHANNEL LEVEL FOR EFFICIENT NETWORK TRAFFIC ISOLATION
2009Analysis and optimization of NBTI induced clock skew in gated clock trees
2009On linewidth-based yield analysis for nanometer lithography
2009Gate sizing for large cell-based designs
2008Power Balanced Gates Insensitive to Routing Capacitance Mismatch
2008Run-time System for an Extensible Embedded Processor with Dynamic Instruction Set
2008Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects
2008Retargetable Code Optimization for Predicated Execution
2007Compositional specification of behavioral semantics
2007Statistical blockade: a novel method for very fast Monte Carlo simulation of rare circuit events, and its application
2006A dynamically reconfigurable packet-switched network-on-chip
2006Optimizing sequential cycles through Shannon decomposition and retiming
2006An effective technique for minimizing the cost of processor software-based diagnosis in SoCs
2005Systematic Transaction Level Modeling of Embedded Systems with SystemC
2005Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices
2005An Application-Specific Design Methodology for STbus Crossbar Generation
2005Design Optimization of Time-and Cost-Constrained Fault-Tolerant Distributed Embedded Systems
2004Wrapper Design for Testing IP Cores with Multiple Clock Domains
2004Automatic Synthesis and Simulation of Continuous-Time [Sigma-Delta] Modulators
2004Poor Mans TBR: A Simple Model Reduction Scheme
2004Digital Ground Bounce Reduction by Phase Modulation of the Clock
2003Exploiting the Routing Flexibility for Energy/Performance Aware Mapping of Regular NoC Architectures
2003Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step
2003Validating SAT Solvers Using an Independent Resolution-Based Checker: Practical Implementations and Other Applications
2002Analysis of Nonlinearities in RF Front-End Architectures Using a Modified Volterra Series Approach
2002Using Problem Symmetry in Search Based Satisfiability Algorithms
2002Reducing Test Application Time Through Test Data Mutation Encoding
2001Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding
2001SystemCSV - an extension of SystemC for mixed multi-level communication modeling and interface-based system design
2001Probabilistic application modeling for system-level perfromance analysis
2000Cost Reduction and Evaluation of a Temporary Faults Detecting Technique
2000Techniques for Reducing Read Latency of Core Bus Wrappers
2000Code Selection for Media Processors with SIMD Instructions
1999A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes
1999Symbolic Functional Vector Generation for VHDL Specifications
1998Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays
1998Reduced-Order Modeling of Large Linear Passive Multi-Terminal Circuits Using Matrix-Pade Approximation

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