Información de la Revista

Journal of Electronic Testing: Theory and Applications (JETTA)

Por favor Iniciar sesión para ver el sitio web de la revista
Cuenta gratuita: consulta los sitios oficiales, sigue las fechas límite y recibe recordatorios por correo.
Iniciar sesión Registrarse

Factor de Impacto:
1.3
Editor:
Springer
ISSN:
0923-8174
Vistas:
16882
Seguidores:
2

Solicitud de Artículos

Journal of Electronic Testing: Theory and Applications (JETTA) is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3, CCF C).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement
Última actualización por Dou Sun el

Los Mejores Artículos

Revistas Relacionadas

Conferencias Relacionadas

CCFICOREAbreviaciónNombre CompletoEntregaNotificaciónFecha de conferencia
BASATInternational Conference on Theory and Applications of Satisfiability Testing2026-02-272026-04-302026-07-20
CICCInternational Conference on Communications2026-10-022027-01-152027-05-30
CBIJCNNInternational Joint Conference on Neural Networks2027-01-312027-03-152027-06-14
CBTrustComInternational Conference on Trust, Security and Privacy in Computing and Communications2025-08-012025-10-012025-11-14
CBICONIPInternational Conference on Neural Information Processing2026-05-102026-07-152026-11-23
CCHPCCInternational Conference on High Performance Computing and Communications2026-07-152026-09-102026-10-29
CAGECCOGenetic and Evolutionary Computation Conference2027-07-12
CBGlobecomIEEE Global Communications Conference2026-04-012026-08-012026-12-07
CBICPRInternational Conference on Pattern Recognition2026-01-102026-03-312026-08-17
CCKSEMInternational Conference on Knowledge Science, Engineering and Management2026-02-282026-03-312026-07-17

Comentarios 0

Aún no hay comentarios.

Por favor Iniciar sesión para publicar un comentario