Who publishes Journal of Electronic Testing: Theory and Applications?

Journal of Electronic Testing: Theory and Applications is published by Springer.

What is the impact factor of Journal of Electronic Testing: Theory and Applications?

The reported impact factor of Journal of Electronic Testing: Theory and Applications is 1.3. Impact factor values are reproduced from publishers and may lag the latest JCR release.

What is the CCF ranking of Journal of Electronic Testing: Theory and Applications?

Journal of Electronic Testing: Theory and Applications is ranked CCF C in the China Computer Federation journal catalogue.

ジャーナル情報

Journal of Electronic Testing: Theory and Applications (JETTA)

Q: What is the ISSN of Journal of Electronic Testing: Theory and Applications?

The ISSN of Journal of Electronic Testing: Theory and Applications is 0923-8174.

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インパクトファクター:

1.3

出版社:

Springer

ISSN:

0923-8174

閲覧:

17602

フォロー:

2

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論文募集

Journal of Electronic Testing: Theory and Applications (JETTA) is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3, CCF C).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement

最終更新：Dou Sun（2026-04-11）

ベストペーパー

年	ベストペーパー
2022	Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function
2021	Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects
2020	A Novel Approach of Data Content Zeroization Under Memory Attacks
2018	Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories
2017	A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems
2016	Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing
2015	Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware
2014	Access Port Protection for Reconfigurable Scan Networks
2013	Secure JTAG Implementation Using Schnorr Protocol

CCF	正式名称	インパクトファクター	出版社	ISSN
	Journal of Electronic Testing	1.3	Springer	0923-8174
	Journal of Control Theory and Applications	1.5	Springer	1672-6340
	Journal of Optimization Theory and Applications	1.5	Springer	0022-3239
C	Theory of Computing Systems	0.4	Springer	1432-4350
	Journal of Computational Analysis and Applications		Springer	1521-1398
	International Journal of Information Security	3.2	Springer	1615-5262
	Journal of Internet Services and Applications		Springer	1869-0238
	International Journal of Automation and Computing		Springer	1476-8186
	Journal of Cloud Computing		Springer	2192-113X
	Journal of Big Data	6.4	Springer	2196-1115

CCF	ICORE	CP-I	略称	正式名称	投稿締切	開催日
B	A	76.7	SAT	International Conference on Theory and Applications of Satisfiability Testing	2026-02-27	2026-07-20
C		87.3	ICC	International Conference on Communications	2026-10-02	2027-05-30
C	B	62.6	IJCNN	International Joint Conference on Neural Networks	2027-01-31	2027-06-14
C	B	65.9	TrustCom	International Conference on Trust, Security and Privacy in Computing and Communications	2025-08-01	2025-11-14
C	B	79.9	ICONIP	International Conference on Neural Information Processing	2026-05-10	2026-11-23
C	C	80.8	HPCC	International Conference on High Performance Computing and Communications	2026-07-15	2026-10-29
C	A	87.8	GECCO	Genetic and Evolutionary Computation Conference		2027-07-12
C	B	89.2	Globecom	IEEE Global Communications Conference	2026-04-01	2026-12-07
C	B	86.2	ICPR	International Conference on Pattern Recognition	2026-01-10	2026-08-17
C	C	64.8	KSEM	International Conference on Knowledge Science, Engineering and Management	2026-02-28	2026-07-17

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Journal of Electronic Testing: Theory and Applications (JETTA)

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