会議情報
NordPac 2024: IMAPS Nordic Microelectronics Packaging Conference and Exhibition
https://nordic.imapseurope.org/nordpac/提出日: |
2024-01-31 |
通知日: |
2024-06-01 |
会議日: |
2024-06-11 |
場所: |
Tampere, Finland |
年: |
8 |
閲覧: 4590 追跡: 0 出席: 0
論文募集
Topics Proposed topics of microelectronics and packaging include: Optoelectronics Harsh environment Applications Advanced Packaging Electronics Reliability & Quality Materials & Processes Medical electronics Power electronics Wearable electronics Green Technologies Printed electronics Advanced packaging for MEMS & sensors & sensor systems
最終更新 Dou Sun 2023-12-04
関連会議
関連仕訳帳
| CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
|---|---|---|---|---|
| Microelectronics Reliability | 1.600 | Elsevier | 0026-2714 | |
| Microelectronic Engineering | 2.600 | Elsevier | 0167-9317 | |
| Microelectronics Journal | Elsevier | 0026-2692 | ||
| Russian Microelectronics | Springer | 1063-7397 | ||
| AEU - International Journal of Electronics and Communications | 3.000 | Elsevier | 1434-8411 | |
| Journal of Electrical And Electronics Engineering | 2.300 | IJRDO | 2456-6055 | |
| International Journal of Advanced Mechanical Engineering & Applications | AR Publication | 0000-0000 | ||
| International Journal of Applied Control, Electrical and Electronics Engineering | AIRCC | 2394-0816 | ||
| c | Journal of Electronic Testing: Theory and Applications | 1.100 | Springer | 0923-8174 |
| ET Microwaves, Antennas & Propagation | 1.100 | IET | 1751-8725 |
| 完全な名前 | インパクト ・ ファクター | 出版社 |
|---|---|---|
| Microelectronics Reliability | 1.600 | Elsevier |
| Microelectronic Engineering | 2.600 | Elsevier |
| Microelectronics Journal | Elsevier | |
| Russian Microelectronics | Springer | |
| AEU - International Journal of Electronics and Communications | 3.000 | Elsevier |
| Journal of Electrical And Electronics Engineering | 2.300 | IJRDO |
| International Journal of Advanced Mechanical Engineering & Applications | AR Publication | |
| International Journal of Applied Control, Electrical and Electronics Engineering | AIRCC | |
| Journal of Electronic Testing: Theory and Applications | 1.100 | Springer |
| ET Microwaves, Antennas & Propagation | 1.100 | IET |