Journal Information
Microelectronics Reliability
http://www.journals.elsevier.com/microelectronics-reliability/
Impact Factor:
1.483
Publisher:
Elsevier
ISSN:
0026-2714
Viewed:
7450
Tracked:
3

Call For Papers
Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
Additional regular features will include:
• Special issues devoted to significant international conferences, or to important developing topics
• Letters to the Editors
• Industrial news and updates
• Calendar of forthcoming events
• Book reviews

Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.
Last updated by Dou Sun in 2019-12-05
Special Issues
Special Issue on Design, Technology, and Test of Integrated Circuits and Systems
Submission Date: 2020-09-30

Microelectronics Reliability seeks original manuscripts for a Special Issue on Design, Technology, and Test of Integrated Circuits and Systems scheduled to appear in an issue of 2021. One of the main challenges for the electronic research field is to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest of this Special Issue include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products. As a side effect of the device size shrinking, classical computing approaches are no more attractive and novel emerging paradigms technologies are progressively raising interests to the scientific community, which is actually working on: computing-in-memory architectures, approximate computing, evolvable computing, MEMRISTOR based devices and so on. Topics of the Special Issue include, but are not limited to: Integrated System Design: SOC and SIP Design; Multiprocessor systems; Embedded Systems; Wireless Systems; Network on Chip; Neuromorphic Computation; Analog, Mixed Signal and RF Systems; MEMS and MOEMS; Low Voltage and Low Power Systems; Synthesis (physical, logic); Simulation, Validation and Verification; Hardware Security Integrated System Technology: Emerging Resistive Memories; Nanoelectronics; Device Modeling; Material Characterization; Failure Analysis; New Components; Packaging; Process Technology; Reliability Issues; Innovative Technologies Integrated System Testing and Reliability: Test and Security Issues; Defect and Fault Modeling; Analog and Mixed Signal Testing; MEMS/MOEMS Testing; SOC and SIP Testing; Delay Testing; Memory Testing; Single Event Effect on Electronics; Radiation effects and Radiation Hardening; Fault Simulation, ATPG; DFT, BIST, BISR; On-line Testing; Fault Tolerant Systems; Approximate Computing; Quantum Computing; Alternative Test Strategies
Last updated by Dou Sun in 2020-08-11
Related Journals
CCFFull NameImpact FactorPublisherISSN
Microelectronics Reliability1.483Elsevier0026-2714
Microelectronics Journal1.284Elsevier0026-2692
Russian Microelectronics Springer1063-7397
The Electronic Library0.886Emerald0264-0473
Electronics1.764MDPI2079-9292
Virtual Reality0.341Springer1359-4338
Chinese Journal of Electronics CIE1022-4653
International Journal on Organic Electronics AIRCC2319-4359
Journal of Molecular Graphics and Modelling1.863Elsevier1093-3263
Microelectronic Engineering1.654Elsevier0167-9317
Full NameImpact FactorPublisher
Microelectronics Reliability1.483Elsevier
Microelectronics Journal1.284Elsevier
Russian Microelectronics Springer
The Electronic Library0.886Emerald
Electronics1.764MDPI
Virtual Reality0.341Springer
Chinese Journal of Electronics CIE
International Journal on Organic Electronics AIRCC
Journal of Molecular Graphics and Modelling1.863Elsevier
Microelectronic Engineering1.654Elsevier
Related Conferences
CCFCOREQUALISShortFull NameSubmissionNotificationConference
ACPEEAsia Conference on Power and Electrical Engineering2020-11-252020-12-302021-04-08
IVAInternational Conference on Intelligent Virtual Agents2020-06-152020-07-152020-09-09
ICEMCInternational Conference on E-business and Mobile Commerce2020-03-312020-04-202020-05-27
AsianHOSTAsian Hardware Oriented Security and Trust Symposium2018-07-272018-09-152018-12-15
GIISGlobal Information Infrastructure and Networking Symposium2020-07-312020-09-072020-10-28
IC3eIEEE Conference on e-Learning, e-Management and e-Services2020-07-312020-08-312020-11-17
CYBIInternational Conference on Cybernetics & Informatics2020-10-032020-11-302021-03-27
AMRMTInternational Conference on Advanced Materials Research and Manufacturing Technologies2020-07-102020-07-252020-08-13
AMCSEInternational Conference Applied Mathematics, Computational Science and Systems Engineering2020-08-25 2020-09-02
MEAInternational Conference on Mechanism, Electronics and Automation2016-11-20 2016-11-25
Recommendation