Información de la conferencia
IDT 2015: IEEE International Design & Test Symposium
http://idt2015.org/
Día de Entrega:
2015-10-11 Extended
Fecha de Notificación:
2015-10-30
Fecha de Conferencia:
2015-12-14
Ubicación:
Dead Sea, Jordan
Años:
10
Vistas: 3285   Seguidores: 0   Asistentes: 0

Ubicación
Solicitud de Artículos
The International Design and Test Symposium is an IEEE-sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2015 edition is organized and sponsored by JUST (Jordan University of Science & Technology) and AAU (Amman Arab University) in collaboration with JCP (Jordan Competitiveness Program). It is also technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. 

Topics of interest include but are not limited to:

Topics

Design Methods and Tools

    IP and SOC Design
    Multiprocessor/Multi-core Systems
    Embedded Systems
    DFX
    Analog, Mixed Signal and RF Design
    High Speed Circuits Design
    Design of MEMS and MOEMS
    Low Voltage and Low Power systems
    Innovative Technologies
    Real Time Systems
    Simulation, Validation & Verification
    System Specification and Modeling
    Formal Methods and Verification
    System Design/Synthesis/Optimization

Test and Reliability

    Yield Learning
    IP and SOC Testing
    Multiprocessor/Multi-Core Systems Test
    Memory & FPGA Test & Repair
    Delay Testing
    High Speed, Analog, Mixed Signal & RF Testing
    MEMS/MOEMS Testing
    Defect and Fault Modeling
    DFT, BIST and BISR
    On-line Testing / Fault Tolerance
    Fault Simulation, ATPG
    Reliability Failures/ Modeling
    Circuit Reliability
    Electronic System Reliability

Regular Submissions

IDT’15 invites original, unpublished paper submissions. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features and describe its current status. All submissions are to be made electronically through the IDT’15 website. Detailed instructions for submissions are to be found at the IDT’15 website. A submission will be considered as evidence that, upon acceptance, the author(s) will prepare the final camera-ready version of the paper in time for inclusion in the proceedings, and will present the paper at the conference. All papers will be taken into consideration for the IDT 2015 Best Paper Award. In addition, a set of best papers will be considered for IEEE Design & Test.

Special Session proposals

IDT’15 solicits Special Sessions, such as (a) Hot-Topic session addressing and discussing the challenges in topics of interest to the symposium, (b) Embedded tutorials introducing and discussing topics of interest to the attendees, (c) Panels discussing visionary and/or controversial issues. Special Session proposals consist of an extended summary (up to 1500 words) as PDF file, describing the session content and format, and must be submitted electronically through the IDT’15 website.

Publications

IDT’15 will produce a Formal Proceedings of accepted papers, published by the IEEE. The proceedings will be available to all participants during the symposium.
Última Actualización Por Dou Sun en 2015-10-04
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