Conference Information
ICSICT 2026: International Conference on Solid-State and Integrated Circuit Technology
https://www.icsict.org/Submission Date: |
2026-06-25 |
Notification Date: |
2026-07-25 |
Conference Date: |
2026-10-27 |
Location: |
Hangzhou, China |
Years: |
18 |
Viewed: 34 Tracked: 0 Attend: 0
Call For Papers
Conference Scope: The following are the technical tracks and research directions of ICSICT 2026 (paper submissions are solicited in, but not limited to the following areas)
Theme 1: Digital & System Level IC
Track 1:Digital Architectures & Systems
FPGA Circuits Design & Application
Processors, Accelerators & SoCs
Memory System & Process in Memory
System Level Testability & Reliability
Track 2:Digital Circuits
Digital Blocks
Logical/Physical-Level Security
Non-volatile Memory & Volatile Memory
Circuit Level Reliability Design
Track 3:Design Methodology & EDA
Design for Testability, Reliability & Manufacturability
Modeling,Simulation & Emulation
Design & Technology Co-Optimization
Artificial Intelligence Algorithms for EDA
Theme 2: Analog
Track 4:RF & Wireless
Building Blocks at RF, mm-wave and THz
Rx, Tx or TRx for Wireless Systems
Wireless Sensor, Radar, Imager
Device/Packaging/Modeling at RF, mm-wave and THz
Track 5:Wireline
Electrical/Optical Transmitters/Receivers for Wireline
Clock Generation and Distribution Circuits
Building Blocks for High-Speed Wireline Communications
Track 6:General Analog
Advanced Analog Circuits
High-Speed, High-Precision Data Converters
Imagers, Medical Devices & Display Systems
Efficient Power Management Circuits
Theme 3: Devices
Track 7:CMOS Logic Devices & Sensors
Advanced CMOS Logic Devices
2D & Thin Film Devices & Technologies
Flash & Non-Volatile & 3D Memory Technologies
Sensor, Sensing Microsystem, MEMS, and Bioelectronics
Smart/Intelligent Sensors & Actuators
Device Modeling & Simulation
Track 8:Power Devices & Power IC
Silicon-based Power Devices
Wide Bandgap Power Devices
Power Integrated Circuits、modules & Systems
Power Integrating & Packaging Technology
Power Device Reliability
Power Device Modeling & Simulation
Track 9:Device Reliability & Security
Back-End of Line Reliability & ESD
Aging & Remaining Useful Lifetime Prediction
PUF & Hardware Security
Devices Radiation Reliability
Theme 4: Process & Technologies
Track 10:Semiconductor Process Technologies
Compound Semiconductor Materials & Technologies
Advanced Memory Materials & Technologies
Advanced Process Technologies
Advanced Interconnect Technologies
Process Modeling & Simulation
Track 11:Optoelectronics and Silicon Photonics Integration
High-Speed Optoelectronic Devices
Silicon Photonics & Integration
Photonic Sensors & Image Sensors
Optical Computing Devices
Display Process & Integration
Track 12:Packaging Technologies
2.5D & 3D Integration
Heterogeneous Integration Packaging
Advanced Wire Bonding Technology
Modeling and Simulation for Advanced Packaging
Testing and Reliability in Advanced Packaging
Last updated by Dou Sun in 2025-11-19