Conference Information

IOLTS 2026: IEEE International Symposium on On-Line Testing and Robust System Design

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Submission Date:
2026-02-15
Notification Date:
2026-04-12
Conference Date:
2026-07-01
Location:
Polignano a Mare, Italy
Years:
32
ICORE: C   Viewed: 7050   Tracked: 0   Attend: 0

Conference Partner Index (CP-I)

55.2 / 100
Ranked #829 of 5,682 conferences · Top 15%
Academic recognition (35%)
58
Submission selectivity (20%) No data - scored at the neutral baseline of 50
Editions held (20%)
94
Community attention (10%)
8
Public record completeness (15%)
35

Inputs used: Listed as ICORE C · Editions on record: 32 · Researchers who opened this page in the past 24 months: 2

Missing from the public record: Historical acceptance rates (+4.5) · Past editions (+3.0) · Best-paper records (+2.3)
Organizers can add these from this page after claiming the conference; scores are recomputed nightly. How to raise this score

Confidence 80% - the share of the score backed by observed data rather than the neutral baseline. How this score is calculated · Browse the ranking · Algorithm version 1.1 · Computed 2026-09-19

Call For Papers

IOLTS 2026 (IEEE International Symposium on On-Line Testing and Robust System Design) is a ICORE C conference held in Polignano a Mare, Italy on 2026-07-01. The paper submission deadline is 2026-02-15. Acceptance notifications are sent on 2026-04-12.

You are invited to participate and submit your contributions to IOLTS’26. The areas of interest include (but are not limited to) the following topics: Dependable system design Dependable Computer Architectures Design-for-Reliability Design for Reliability approaches for Low-Power Cross-layer reliability approaches Fault-Tolerant and Fail-Safe systems Functional safety Self-Test and Self-Repair Self-Healing design Self-Regulating design Self-Adapting design Reliability issues of Low-Power Design Robustness evaluation Quality, yield, reliability, and lifespan issues in nanometer technologies Variability, Aging, EMI, and Radiation Effects in nanometer technologies On-line testing techniques for digital, analog, and mixed-signal circuits Self-checking circuits and coding theory On-line monitoring of current, temperature, process variations, and aging Power density and overheating issues in nanometer technologies Field Diagnosis, Maintainability, and Reconfiguration Design for Security Fault-based attacks and countermeasures Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications CAD for robust circuits design
Last updated by Dou Sun on

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