会议信息

IOLTS 2026: IEEE International Symposium on On-Line Testing and Robust System Design

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IOLTS
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截稿日期:
2026-02-15
通知日期:
2026-04-12
会议日期:
2026-07-01
会议地点:
Polignano a Mare, Italy
届数:
32
ICORE: C   浏览: 7048   关注: 0   参加: 0

会伴指数 (CP-I)

55.2 / 100
全站第 829 名 / 共 5,682 个会议 · 前 15%
学术认可 (35%)
58
投稿选择性 (20%) 无数据 —— 按中性基准 50 分计入 —
会议传承 (20%)
94
社区关注 (10%)
8
资料公开度 (15%)
35

用到的输入: 收录等级：ICORE C · 有据可查的届次：32 · 过去 24 个月打开过本页的研究者：2 人

公开资料里还缺: 历年录用率 (+4.5) · 历届信息 (+3.0) · 最佳论文记录 (+2.3)
主办方认领本会议后，可直接在这一页补上；分数每晚重算。如何提升这个分数

置信度 80% —— 分数中有多大比例来自实际观测到的数据，而不是中性基准。 这个分数是怎么算出来的 · 查看完整榜单 · 算法版本 1.1 · 算于 2026-09-19

征稿

IOLTS 2026 (IEEE International Symposium on On-Line Testing and Robust System Design) is a ICORE C conference held in Polignano a Mare, Italy on 2026-07-01. The paper submission deadline is 2026-02-15. Acceptance notifications are sent on 2026-04-12.

You are invited to participate and submit your contributions to IOLTS’26. The areas of interest include (but are not limited to) the following topics: Dependable system design Dependable Computer Architectures Design-for-Reliability Design for Reliability approaches for Low-Power Cross-layer reliability approaches Fault-Tolerant and Fail-Safe systems Functional safety Self-Test and Self-Repair Self-Healing design Self-Regulating design Self-Adapting design Reliability issues of Low-Power Design Robustness evaluation Quality, yield, reliability, and lifespan issues in nanometer technologies Variability, Aging, EMI, and Radiation Effects in nanometer technologies On-line testing techniques for digital, analog, and mixed-signal circuits Self-checking circuits and coding theory On-line monitoring of current, temperature, process variations, and aging Power density and overheating issues in nanometer technologies Field Diagnosis, Maintainability, and Reconfiguration Design for Security Fault-based attacks and countermeasures Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications CAD for robust circuits design
由 Dou Sun 最后更新于

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