You are invited to participate and submit your contributions to IOLTS’26. The areas of interest include (but are not limited to) the following topics:

    Dependable system design
    Dependable Computer Architectures
    Design-for-Reliability
    Design for Reliability approaches for Low-Power
    Cross-layer reliability approaches
    Fault-Tolerant and Fail-Safe systems
    Functional safety
    Self-Test and Self-Repair
    Self-Healing design
    Self-Regulating design
    Self-Adapting design
    Reliability issues of Low-Power Design
    Robustness evaluation
    Quality, yield, reliability, and lifespan issues in nanometer technologies
    Variability, Aging, EMI, and Radiation Effects in nanometer technologies
    On-line testing techniques for digital, analog, and mixed-signal circuits
    Self-checking circuits and coding theory
    On-line monitoring of current, temperature, process variations, and aging
    Power density and overheating issues in nanometer technologies
    Field Diagnosis, Maintainability, and Reconfiguration
    Design for Security
    Fault-based attacks and countermeasures
    Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
    CAD for robust circuits design