会议信息

IOLTS 2026: IEEE International Symposium on On-Line Testing and Robust System Design

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截稿日期:
2026-02-15
通知日期:
2026-04-12
会议日期:
2026-07-01
会议地点:
Polignano a Mare, Italy
届数:
32
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征稿

IOLTS 2026 (IEEE International Symposium on On-Line Testing and Robust System Design) is an academic conference held in Polignano a Mare, Italy on 2026-07-01. The paper submission deadline is 2026-02-15. Acceptance notifications are sent on 2026-04-12.

You are invited to participate and submit your contributions to IOLTS’26. The areas of interest include (but are not limited to) the following topics: Dependable system design Dependable Computer Architectures Design-for-Reliability Design for Reliability approaches for Low-Power Cross-layer reliability approaches Fault-Tolerant and Fail-Safe systems Functional safety Self-Test and Self-Repair Self-Healing design Self-Regulating design Self-Adapting design Reliability issues of Low-Power Design Robustness evaluation Quality, yield, reliability, and lifespan issues in nanometer technologies Variability, Aging, EMI, and Radiation Effects in nanometer technologies On-line testing techniques for digital, analog, and mixed-signal circuits Self-checking circuits and coding theory On-line monitoring of current, temperature, process variations, and aging Power density and overheating issues in nanometer technologies Field Diagnosis, Maintainability, and Reconfiguration Design for Security Fault-based attacks and countermeasures Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications CAD for robust circuits design
由 Dou Sun 最后更新于

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相关期刊

CCF全称影响因子出版商ISSN
Image Processing On LineIPOL2105-1232
Journal of Electronic Testing1.3Springer0923-8174
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
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CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203

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