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IIRW 2016: IEEE International Integrated Reliability Workshop

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IIRW
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투고 마감일:
2016-07-25 Extended
통보일:
개최일:
2016-10-09
개최지:
Stanford Sierra, California, USA
조회: 14238   팔로우: 0   참가: 0

논문 모집

IIRW 2016 (IEEE International Integrated Reliability Workshop) is an academic conference held in Stanford Sierra, California, USA on 2016-10-09. The paper submission deadline is 2016-07-25 (extended).

Scope We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: Designing-in reliability (products, circuits, systems, processes) Resistive memory: degradation mechanisms Deep sub-micron transistor and circuit reliability Customer product reliability requirements / manufacturer reliability tasks Root cause defects, physical mechanisms, and simulations Wafer level reliability tests, test approaches, and reliability test structures Abstract Submission Please prepare your two-page extended abstract (maximum two pages including figures) in pdf format, and submit it to the following URL: https://easychair.org/conferences/?conf=iirw2016 Please follow the IEEE template when preparing your abstract. All submissions will be acknowledged by email within one week. If you do not receive acknowledgement of your submission, please contact the Technical Program Chair. Your abstract should state clearly and concisely the results of your work and why they are significant. Representative data and figures that support your proposal are REQUIRED. Additional Information For further information please contact the Technical Program Chair: Tom Kopley, Fairchild Email: [email protected]
최종 수정: Xin Yao ()

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관련 저널

CCF정식 명칭영향력 지수출판사ISSN
CIEEE Transactions on Reliability5.7IEEE0018-9529
Robotics and Computer-Integrated Manufacturing11.4Elsevier0736-5845
Microelectronics Reliability1.9Elsevier0026-2714
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems5.9Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655

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