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IIRW 2016: IEEE International Integrated Reliability Workshop

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IIRW
投稿締切日:
2016-07-25 Extended
通知日:
開催日:
2016-10-09
開催地:
Stanford Sierra, California, USA
閲覧: 13891   フォロー: 0   参加: 0

論文募集

IIRW 2016 (IEEE International Integrated Reliability Workshop) is an academic conference held in Stanford Sierra, California, USA on 2016-10-09. The paper submission deadline is 2016-07-25 (extended).

Scope We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: Designing-in reliability (products, circuits, systems, processes) Resistive memory: degradation mechanisms Deep sub-micron transistor and circuit reliability Customer product reliability requirements / manufacturer reliability tasks Root cause defects, physical mechanisms, and simulations Wafer level reliability tests, test approaches, and reliability test structures Abstract Submission Please prepare your two-page extended abstract (maximum two pages including figures) in pdf format, and submit it to the following URL: https://easychair.org/conferences/?conf=iirw2016 Please follow the IEEE template when preparing your abstract. All submissions will be acknowledged by email within one week. If you do not receive acknowledgement of your submission, please contact the Technical Program Chair. Your abstract should state clearly and concisely the results of your work and why they are significant. Representative data and figures that support your proposal are REQUIRED. Additional Information For further information please contact the Technical Program Chair: Tom Kopley, Fairchild Email: [email protected]
最終更新：Xin Yao（）

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関連ジャーナル

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