Conference Information
IIRW 2026: IEEE International Integrated Reliability Workshop
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Conference Partner Index (CP-I)
| Academic recognition (35%) | No data - scored at the neutral baseline of 50 | — |
| Submission selectivity (20%) | No data - scored at the neutral baseline of 50 | — |
| Editions held (20%) |
|
65 |
| Community attention (10%) |
|
13 |
| Public record completeness (15%) |
|
70 |
Inputs used: Editions on record: 10 · Researchers who opened this page in the past 24 months: 5
Missing from the public record:
Historical acceptance rates (+4.5)
Organizers can add these from this page after claiming the conference; scores are recomputed nightly. How to raise this score
Confidence 45% - the share of the score backed by observed data rather than the neutral baseline. How this score is calculated · Browse the ranking · Algorithm version 1.1 · Computed 2026-09-07
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Based on the previous edition, the next deadline is estimated around 2027-09.
Call For Papers
IIRW 2026 (IEEE International Integrated Reliability Workshop) is an academic conference held in South Lake Tahoe, California, USA on 2026-10-04. The paper submission deadline is 2026-09-04.
Best Papers
| Year | Best Papers |
|---|---|
| 2025 | Bias temperature instability in 22nm FDSOI transistors at cryogenic temperatures |
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Related Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| C | IEEE Transactions on Reliability | 5.7 | IEEE | 0018-9529 |
| Robotics and Computer-Integrated Manufacturing | 11.4 | Elsevier | 0736-5845 | |
| Microelectronics Reliability | 1.9 | Elsevier | 0026-2714 | |
| A | IEEE Transactions on Multimedia | 9.7 | IEEE | 1520-9210 |
| C | Knowledge-Based Systems | 7.2 | Elsevier | 0950-7051 |
| B | Software & Systems Modeling | 3.2 | Springer | 1619-1366 |
| A | IEEE Transactions on Computers | 3.8 | IEEE | 0018-9340 |
| C | Future Generation Computer Systems | 5.9 | Elsevier | 0167-739X |
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| C | Pattern Recognition Letters | 3.9 | Elsevier | 0167-8655 |
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