저널 정보

Journal of Electronic Testing

저널 웹사이트를 보려면 로그인해 주세요
무료 가입으로 공식 사이트 조회, 마감 추적, 이메일 리마인더를 이용할 수 있습니다.
회원가입 로그인
이 데이터를 API로 가져오기
검색과 순위 목록은 자격 증명이 전혀 필요 없습니다. 이 페이지의 상세 데이터에는 무료 API 키가 필요합니다. 자세한 내용은 개발자 안내 페이지를 참고하세요.
영향력 지수:
1.3
출판사:
Springer
ISSN:
0923-8174
조회:
20286
팔로우:
0

논문 모집

Journal of Electronic Testing is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement
최종 수정: Dou Sun ()

베스트 페이퍼

관련 저널

CCF정식 명칭영향력 지수출판사ISSN
CJournal of Electronic Testing: Theory and Applications1.3Springer0923-8174
International Journal of Information Security3.2Springer1615-5262
International Journal of Automation and ComputingSpringer1476-8186
Journal of Cloud ComputingSpringer2192-113X
Journal of Big Data6.4Springer2196-1115
Journal of Computational Electronics2.5Springer1569-8025
Electronic Commerce Research4.7Springer1389-5753
Journal of Interaction ScienceSpringer2194-0827
Journal of Signal Processing Systems1.8Springer1939-8018
Journal of Medical Systems5.7Springer0148-5598

관련 학회

댓글 0

아직 댓글이 없습니다.

댓글을 작성하려면 로그인해 주세요