Who publishes Journal of Electronic Testing?

Journal of Electronic Testing is published by Springer.

What is the ISSN of Journal of Electronic Testing?

The ISSN of Journal of Electronic Testing is 0923-8174.

What is the impact factor of Journal of Electronic Testing?

The reported impact factor of Journal of Electronic Testing is 1.3. Impact factor values are reproduced from publishers and may lag the latest JCR release.

Información de la Revista

Journal of Electronic Testing

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Factor de Impacto:

1.3

Editor:

Springer

ISSN:

0923-8174

Vistas:

20826

Seguidores:

0

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Solicitud de Artículos

Journal of Electronic Testing is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement

Última actualización por Dou Sun el 2025-12-28

Los Mejores Artículos

Año	Los Mejores Artículos
2022	Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function

Revistas Relacionadas

CCF	Nombre Completo	Factor de Impacto	Editor	ISSN
C	Journal of Electronic Testing: Theory and Applications	1.3	Springer	0923-8174
	International Journal of Information Security	3.2	Springer	1615-5262
	International Journal of Automation and Computing		Springer	1476-8186
	Journal of Cloud Computing		Springer	2192-113X
	Journal of Big Data	6.4	Springer	2196-1115
	Journal of Computational Electronics	2.5	Springer	1569-8025
	Electronic Commerce Research	4.7	Springer	1389-5753
	Journal of Interaction Science		Springer	2194-0827
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	Journal of Medical Systems	5.7	Springer	0148-5598

Conferencias Relacionadas

CCF	ICORE	CP-I	Abreviación	Nombre Completo	Entrega	Fecha de conferencia
B	A	76,7	SAT	International Conference on Theory and Applications of Satisfiability Testing	2026-02-27	2026-07-20
	C	70,6	ICTSS	International Conference on Testing Software and Systems	2025-06-16	2025-09-17
		46,0	AITest	IEEE International Conference On Artificial Intelligence Testing	2025-04-30	2025-07-21
C	A	81,1	ICST	International Conference on Software Testing, Verification and Validation	2026-11-02	2027-05-17
A	A	92,7	ISSTA	International Symposium on Software Testing and Analysis	2027-01-08	2027-09-07
		43,1	STAML	International Conference on Software Testing and Analysis and Machine Learning	2024-06-14	2024-06-28
		39,8	NCST	National Conference on Software Testing	2013-08-31	2013-10-25
		43,8	AQTR	IEEE International Conference on Automation, Quality and Testing, Robotics	2026-02-23	2026-05-21
		43,6	SATE	The Annual Conference on Software Analysis, Testing and Evolution	2019-07-31	2019-11-24
		46,0	SEETEST	South East European Software Testing Conference		2024-09-26

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