Información de la Revista

Journal of Electronic Testing

Por favor Iniciar sesión para ver el sitio web de la revista
Cuenta gratuita: consulta los sitios oficiales, sigue las fechas límite y recibe recordatorios por correo.
Iniciar sesión Registrarse

Factor de Impacto:
1.3
Editor:
Springer
ISSN:
0923-8174
Vistas:
19152
Seguidores:
0

Solicitud de Artículos

Journal of Electronic Testing is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement
Última actualización por Dou Sun el

Los Mejores Artículos

Revistas Relacionadas

CCFNombre CompletoFactor de ImpactoEditorISSN
cJournal of Electronic Testing: Theory and Applications1.3Springer0923-8174
International Journal of Information Security3.2Springer1615-5262
International Journal of Automation and ComputingSpringer1476-8186
Journal of Cloud ComputingSpringer2192-113X
Journal of Big Data6.4Springer2196-1115
Electronic Commerce Research4.7Springer1389-5753
Journal of Computational Electronics2.5Springer1569-8025
Journal of Interaction ScienceSpringer2194-0827
Journal of Signal Processing Systems1.8Springer1939-8018
Electronic Markets6.8Springer1019-6781

Conferencias Relacionadas

Comentarios 0

Aún no hay comentarios.

Por favor Iniciar sesión para publicar un comentario

Publicidad