ジャーナル情報

Journal of Electronic Testing

ジャーナルのウェブサイトを表示するにはログインしてください
無料登録で公式サイトの閲覧、締切のトラッキング、メールリマインダーが利用できます。
ログイン 新規登録

インパクトファクター:
1.3
出版社:
Springer
ISSN:
0923-8174
閲覧:
20102
フォロー:
0

論文募集

Journal of Electronic Testing is an academic journal published by Springer. (ISSN 0923-8174, impact factor 1.3).

Aims and scope The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufac turing yield and design for yield improvement; Failure mode analysis and process improvement
最終更新：Dou Sun（）

ベストペーパー

関連ジャーナル

CCF正式名称インパクトファクター出版社ISSN
CJournal of Electronic Testing: Theory and Applications1.3Springer0923-8174
International Journal of Information Security3.2Springer1615-5262
International Journal of Automation and ComputingSpringer1476-8186
Journal of Cloud ComputingSpringer2192-113X
Journal of Big Data6.4Springer2196-1115
Journal of Computational Electronics2.5Springer1569-8025
Electronic Commerce Research4.7Springer1389-5753
Journal of Interaction ScienceSpringer2194-0827
Journal of Signal Processing Systems1.8Springer1939-8018
Journal of Medical Systems5.7Springer0148-5598

関連会議

コメント 0

まだコメントはありません。

コメントするにはログインしてください