Conference Information
QCAV 2019: Quality Control by Artificial Vision
Submission Date:
2018-11-01 Extended
Notification Date:
Conference Date:
Mulhouse, France
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Conference Location
Call For Papers

Quality Control by Artificiel Vision is a domain, where the latest scientific advances in image processing  and optics are combined with the latest advanced technologies.

In 2019, we will see that artificial intelligence and deep learning techniques will shake up the traditional approaches in the QCAV fields. But, we will also see, the latest advances in acquisition techniques, such as the new active sensors for 3D or light-field systems are also of first importance.

For several years, the combination of new acquisition methods combined with smart image processing algorithms, allowed the Quality Control by Artificial Vision to emerge as a complete scientific domain. Its future will be promising and the conference QCAV 2019 will be the best place to share our knowledge and talk about the recent advaces of machine vision.
The objective of the QCAV2019 conference is to gather researchers, engineers, suppliers and users of vision systems. Be numerous for this important event.


All papers describing novel theoretical, experimental, and applied work in image processing and computer vision for industrial applications are wellcomes. Papers are solicited from, but not limited to, the following categories:

    Image Acquisition, Vision Sensors, Machine vision
    3D machine vision (stereovision, laser triangulation, multi-cameras, etc…)
    Non conventional imaging (holography, polarimetric, light-field and plenoptic imaging)
    Machine learning, deep learning, IA
    Non-destructive testing and metrology
    Image Analysis, geometrical description, segmentation
    Vision for Autonomous vehicles, Automatic Guided Vehicles, Unmanned ground and aerial vehicle
    Low-level vision and Image Processing, hardware and real time processing
    Optical, Electron, X-ray, Ultrasound, TheraHertz and others imaging modalities
    Non-destructive Testing and Metrology
    Image Processing and Segmentation, Image Interpretation and Pattern Recognition
    Image Analysis and Geometrical Description
    Process Automation, Characterization and Control

The proceedings will be published in the SPIE Digital Library.
Last updated by Dou Sun in 2018-09-23
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