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QCAV 2019: Quality Control by Artificial Vision

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QCAV
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投稿締切日:
2018-11-01 Extended
通知日:
2018-12-19
開催日:
2019-05-15
開催地:
Mulhouse, France
閲覧: 14527   フォロー: 0   参加: 0

論文募集

QCAV 2019 (Quality Control by Artificial Vision) is an academic conference held in Mulhouse, France on 2019-05-15. The paper submission deadline is 2018-11-01 (extended). Acceptance notifications are sent on 2018-12-19.

Scope Quality Control by Artificiel Vision is a domain, where the latest scientific advances in image processing and optics are combined with the latest advanced technologies. In 2019, we will see that artificial intelligence and deep learning techniques will shake up the traditional approaches in the QCAV fields. But, we will also see, the latest advances in acquisition techniques, such as the new active sensors for 3D or light-field systems are also of first importance. For several years, the combination of new acquisition methods combined with smart image processing algorithms, allowed the Quality Control by Artificial Vision to emerge as a complete scientific domain. Its future will be promising and the conference QCAV 2019 will be the best place to share our knowledge and talk about the recent advaces of machine vision. The objective of the QCAV2019 conference is to gather researchers, engineers, suppliers and users of vision systems. Be numerous for this important event. Topics All papers describing novel theoretical, experimental, and applied work in image processing and computer vision for industrial applications are wellcomes. Papers are solicited from, but not limited to, the following categories: Image Acquisition, Vision Sensors, Machine vision 3D machine vision (stereovision, laser triangulation, multi-cameras, etc…) Non conventional imaging (holography, polarimetric, light-field and plenoptic imaging) Machine learning, deep learning, IA Non-destructive testing and metrology Image Analysis, geometrical description, segmentation Vision for Autonomous vehicles, Automatic Guided Vehicles, Unmanned ground and aerial vehicle Low-level vision and Image Processing, hardware and real time processing Optical, Electron, X-ray, Ultrasound, TheraHertz and others imaging modalities Non-destructive Testing and Metrology Image Processing and Segmentation, Image Interpretation and Pattern Recognition Image Analysis and Geometrical Description Process Automation, Characterization and Control The proceedings will be published in the SPIE Digital Library.
最終更新：Dou Sun（）

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