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QCAV 2019: Quality Control by Artificial Vision

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투고 마감일:
2018-11-01 Extended
통보일:
2018-12-19
개최일:
2019-05-15
개최지:
Mulhouse, France
조회: 14182   팔로우: 0   참가: 0

논문 모집

QCAV 2019 (Quality Control by Artificial Vision) is an academic conference held in Mulhouse, France on 2019-05-15. The paper submission deadline is 2018-11-01 (extended). Acceptance notifications are sent on 2018-12-19.

Scope Quality Control by Artificiel Vision is a domain, where the latest scientific advances in image processing and optics are combined with the latest advanced technologies. In 2019, we will see that artificial intelligence and deep learning techniques will shake up the traditional approaches in the QCAV fields. But, we will also see, the latest advances in acquisition techniques, such as the new active sensors for 3D or light-field systems are also of first importance. For several years, the combination of new acquisition methods combined with smart image processing algorithms, allowed the Quality Control by Artificial Vision to emerge as a complete scientific domain. Its future will be promising and the conference QCAV 2019 will be the best place to share our knowledge and talk about the recent advaces of machine vision. The objective of the QCAV2019 conference is to gather researchers, engineers, suppliers and users of vision systems. Be numerous for this important event. Topics All papers describing novel theoretical, experimental, and applied work in image processing and computer vision for industrial applications are wellcomes. Papers are solicited from, but not limited to, the following categories: Image Acquisition, Vision Sensors, Machine vision 3D machine vision (stereovision, laser triangulation, multi-cameras, etc…) Non conventional imaging (holography, polarimetric, light-field and plenoptic imaging) Machine learning, deep learning, IA Non-destructive testing and metrology Image Analysis, geometrical description, segmentation Vision for Autonomous vehicles, Automatic Guided Vehicles, Unmanned ground and aerial vehicle Low-level vision and Image Processing, hardware and real time processing Optical, Electron, X-ray, Ultrasound, TheraHertz and others imaging modalities Non-destructive Testing and Metrology Image Processing and Segmentation, Image Interpretation and Pattern Recognition Image Analysis and Geometrical Description Process Automation, Characterization and Control The proceedings will be published in the SPIE Digital Library.
최종 수정: Dou Sun ()

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관련 저널

CCF정식 명칭영향력 지수출판사ISSN
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CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203
IEEE Access3.6IEEE2169-3536
AIEEE Transactions on Dependable and Secure Computing7.5IEEE1545-5971

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