Conference Information

PRIA 2026: International Conference on Pattern Recognition and Image Analysis

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Submission Date:
2026-10-22 Closed
Notification Date:
2026-11-01
Conference Date:
2026-11-06
Location:
Zhengzhou, China
Years:
3
Viewed: 588   Tracked: 0   Attend: 0
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Conference Partner Index (CP-I)

41.6 / 100
Ranked #4,815 of 5,761 conferences · Top 84%

#226 of 246 in Computer Vision & Pattern Recognition

Academic recognition (35%) No data - scored at the neutral baseline of 50 —
Submission selectivity (20%) No data - scored at the neutral baseline of 50 —
Editions held (20%)
37
Community attention (10%)
13
Public record completeness (15%)
35

Inputs used: Editions on record: 3 · Researchers who opened this page in the past 24 months: 5

Missing from the public record: Historical acceptance rates (+4.5) · Past editions (+3.0) · Best-paper records (+2.3)
Organizers can add these from this page after claiming the conference; scores are recomputed nightly. How to raise this score

Confidence 45% - the share of the score backed by observed data rather than the neutral baseline. How this score is calculated · Browse the ranking · Algorithm version 1.2 · Computed 2026-10-28

Call For Papers

PRIA 2026 (International Conference on Pattern Recognition and Image Analysis) is an academic conference held in Zhengzhou, China on 2026-11-06. The paper submission deadline is 2026-10-22. Acceptance notifications are sent on 2026-11-01.

The 2026 3rd International Conference on Pattern Recognition and Image Analysis (PRIA 2026) will be held on November 6-8, 2026, in Zhengzhou, China, which will focus on the field of Pattern Recognition and Image Analysis to discuss the latest research results, technological breakthroughs, and cutting-edge trends in the field. The conference will provide a rich and diverse academic program, including keynote discussions, invited presentations, oral presentations, poster presentations, and symposiums, providing participants with opportunities for in-depth academic exchanges and collaborations. The conference will include expert forums, academic reports, workshops, poster presentations, and other forms, covering various fields such as pattern recognition, image processing, computer vision, artificial intelligence,and so on. Whether you are an expert scholar, researcher, graduate student, or industrial practitionerin this field, you will benefit from this conference to jointly promote the development and innovation in pattern recognition and image analysis. We look forward to your participation in discussing the hot topics in this field, sharing your academic achievements, and creating a bright future inthe field of digital technology together! PUBLICATION All papers will be reviewed by two or three expert reviewers from the conference committees. After a careful reviewing process, all accepted papers will be published in the Conference Proceedings by SPIE-The International Society for Optical Engineering (ISSN: 0277-786X), and submitted to EI Compendex, Scopus for indexing. CALL FOR PAPERS Topics of interest for submission include, but are not limited to: 1. Fundamentals of pattern recognition: pattern representation, feature extraction, classifier design and evaluation 2. Image processing and analysis: image enhancement, segmentation, texture analysis, shape analysis 3. Target Recognition and Detection: object detection, face recognition, target tracking, license plate recognition 4. Biometrics: Fingerprint, Iris, Facial Recognition 5. Medical image analysis: medical imaging, disease diagnosis, image segmentation 6. Remote sensing image analysis: remote sensing data processing, land use classification, target detection 7. Video Analysis: Motion Recognition, Video Summarization, Anomaly Detection 8. Text Recognition and Analysis: Optical Character Recognition, Text Mining, Handwriting Recognition 9. Machine Learning and Pattern Recognition: Supervised Learning, Unsupervised Learning, Deep Learning 10. Deep Learning in Pattern Recognition: Convolutional Neural Networks, Generative Adversarial Networks 11. Computer vision: 3D vision, multi-view geometry, image alignment
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