Conference Information

CPEM 2026: Conference on Precision Electromagnetic Measurements

Please Login to view website of conference

Submission Date:
2026-02-27
Notification Date:
2026-05-08
Conference Date:
2026-09-06
Location:
Madrid, Spain
Years:
35
Viewed: 2482   Tracked: 0   Attend: 0

Call For Papers

CPEM 2026 (Conference on Precision Electromagnetic Measurements) is an academic conference held in Madrid, Spain on 2026-09-06. The paper submission deadline is 2026-02-27. Acceptance notifications are sent on 2026-05-08.

Topics Fundamental constants and universality tests Time and frequency Photonics and optical metrology Quantum voltage standards and technologies Single photon and particle detectors Quantum sensors and detectors Kibble balance and extensions Current Voltage DC resistance Impedance Magnetics Power and energy High voltage and current Aplication of artificial inteligent and machine learning to electrical measurements Quantum resistance and impedance standards and technologies Radio frequency / Microwave
Last updated by Dou Sun in

Related Conferences

CCFCOREQUALISShortFull NameSubmissionNotificationConference
baa2ESEMInternational Symposium on Empirical Software Engineering and Measurement2026-04-222026-06-302026-10-04
baa1IMCInternet Measurement Conference2026-04-222026-08-042026-11-03
b3DDECSIEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems2026-01-112026-02-272026-04-27
b1ISQEDInternational Symposium on Quality Electronic Design2025-11-172026-01-222026-04-08
cba2PAMPassive and Active Measurement conference2024-10-012024-11-142025-03-10
bISPECInternational Conference on Information Security Practice and Experience2024-05-132024-06-242024-10-25
baVEEInternational Conference on Virtual Execution Environments2021-12-032022-01-152022-04-20
b1ICECSInternational Conference on Electronics, Circuits and Systems2017-09-052017-10-102017-12-05
b1ICEC'International Conference on Electronic Commerce2013-03-162013-04-242013-08-13
b5CSEEInternational Conference on Computer Science and Electronic Engineering2012-12-312013-01-072013-03-22

Related Journals