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VALID 2024: International Conference on Advances in System Testing and Validation Lifecycle

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VALID
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투고 마감일:
2024-06-17
통보일:
2024-08-04
개최일:
2024-09-29
개최지:
Venice, Italy
개최 횟수:
16
조회: 11373   팔로우: 0   참가: 0

회반 지수 (CP-I)

49.0 / 100
전체 5,682개 중 1,799위 · 상위 32%
학술적 인정 (35%) 데이터 없음 — 중립 기준값 50점으로 계산 —
투고 선별성 (20%) 데이터 없음 — 중립 기준값 50점으로 계산 —
개최 횟수 (20%)
76
커뮤니티 관심도 (10%)
10
공개 자료 충실도 (15%)
35

사용한 입력: 확인되는 개최 횟수: 16 · 지난 24개월 동안 이 페이지를 연 연구자: 3명

공개 자료에서 빠진 항목: 역대 게재율 (+4.5) · 역대 회차 (+3.0) · 최우수 논문 기록 (+2.3)
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신뢰도 45% — 점수 중 중립 기준값이 아니라 실제 관측된 데이터에 근거한 비율. 이 점수는 어떻게 계산되나 · 전체 순위 보기 · 알고리즘 버전 1.1 · 산출일 2026-09-18

논문 모집

VALID 2024 (International Conference on Advances in System Testing and Validation Lifecycle) is an academic conference held in Venice, Italy on 2024-09-29. The paper submission deadline is 2024-06-17. Acceptance notifications are sent on 2024-08-04.

Complex distributed systems with heterogeneous interconnections operating at different speeds and based on various nano- and micro-technologies raise serious problems of testing, diagnosing, and debugging. Despite current solutions, virtualization and abstraction for large scale systems provide less visibility for vulnerability discovery and resolution, and make testing tedious, sometimes unsuccessful, if not properly thought from the design phase. The conference on advances in system testing and validation considers the concepts, methodologies, and solutions dealing with designing robust and available systems. Its target covers aspects related to debugging and defects, vulnerability discovery, diagnosis, and testing. The conference VALID 2024 continues a series of events focusing on designing robust components and systems with testability for varia features of behavior and interconnection. The conference will provide a forum where researchers shall be able to present recent research results and new research problems and directions related to them. The conference seeks contributions presenting novel result and future research in all aspects of robust design methodologies, vulnerability discovery and resolution, diagnosis, debugging, and testing. We solicit both academic, research, and industrial contributions. We welcome technical papers presenting research and practical results, position papers addressing the pros and cons of specific proposals, such as those being discussed in the standard fora or in industry consortia, survey papers addressing the key problems and solutions on any of the above topics short papers on work in progress, and panel proposals. Industrial presentations are not subject to the format and content constraints of regular submissions. We expect short and long presentations that express industrial position and status. Tutorials on specific related topics and panels on challenging areas are encouraged. The topics suggested by the conference can be discussed in term of concepts, state of the art, research, standards, implementations, running experiments, applications, and industrial case studies. Authors are invited to submit complete unpublished papers, which are not under review in any other conference or journal in the following, but not limited to, topic areas. All topics and submission formats are open to both research and industry contributions. VALID 2024 conference tracks: Trends and achievements Testing and validating Industry 4.0 applications; Testing and validating Internet of Things (IoT) systems; Big Datasets validation; Validate patch generation systems; Automation in defect prediction models; Automated test suite for time-continuous models; Learning semantics for defect prediction; Variability and bug-finding; Mining sandboxes; Validation confidence quantification; Validating mission-critical applications; Validating accessibility requirements; Validation prediction-oriented applications; Validation of high-risk applications and systems; Testing and validation of Internet of Vehicle (IoV) systems Robust design methodologies Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering Vulnerability discovery and resolution Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection Defects and Debugging Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles Diagnosis Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo bile environments System and feature testing Test strategy for systems-in-package; Testing embedded systems; Testing high-speed systems; Testing delay and performance; Testing communication traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware testing; Supply-chain testing; Memory testing; Microprocessor testing; Mixed-signal production test; Testing multi-voltage domains; Interconnection and compatibility testing; SAT procedures for application to testing and formal verification Testing techniques and mechanisms Fundamentals for digital and analog testing; Emerging testing methodologies; Engineering test coverage; Designing testing suites; Statistical testing; Functional testing; Parametric testing; Defect- and data-driven testing; Automated testing; Embedded testing; Autonomous self-testing; Low cost testing; Optimized testing; Testing systems and devices; Test standards Testing of wireless communications systems Testing of mobile wireless communication systems; Testing of wireless sensor networks; Testing of radio-frequency identification systems; Testing of ad-hoc networks; Testing methods for emerging standards; Hardware-based prototyping of wireless communication systems; Physical layer performance verification; On-chip testing of wireless communication systems; Modeling and simulation of wireless channels; Noise characterization and validation; Case studies and industrial applications of test instruments; Software verification and validation High-speed interface verification and fault-analysis; Software testing theory and practice; Model-based testing; Verification metrics; Service/application specific testing; Model checking; OO software testing; Testing embedded software; Quality assurance; Empirical studies for verification and validation; Software inspection techniques; Software testing tools; New approaches for software reliability verification and validation Quality-assessment of software architectures and legacy systems Quality-Assessment of Software Architectures and Legacy systems; Quality-assessment of software architectures; Validation and verification of software architecture; Automatic analysis of legacy code; Strategies for isolating legacy code and improving the design quality; Metrics for evaluating architectural quality characteristics; Tools for quality assessments of software architectures; Techniques and tools for testing legacy systems Testing and validation of run-time evolving systems Automated testing for run-time evolving systems; Testing and validation of evolving systems; Testing and validation of self-controlled systems; Testing compile-time versus run-time dependency for evolving systems; On-line validation and testing of evolving at run-time systems; Modeling for testability of evolving at run-time systems; Near real-time and real-time monitoring of run-time evolving systems; Verification and validation of reflective models for testing; Verification and validation of fault tolerance in run-time evolving systems Feature-oriented testing Testing user interfaces and user-driven features; Privacy testing; Ontology accuracy testing; Testing semantic matching; Testing certification processes; Testing authentication mechanisms; Testing biometrics methodologies and mechanisms; Testing cross-nation systems; Testing system interoperability; Testing system safety; Testing system robustness; Testing temporal constraints; Testing transaction-based properties; Directed energy test capabilities /microwave, laser, etc./; Testing delay and latency metrics Domain-oriented testing Testing autonomic and autonomous systems; Testing intrusion prevention systems; Firewall testing; Information assurance testing; Testing social network systems; Testing recommender systems; Testing biometric systems; Testing diagnostic systems; Testing on-line systems; Testing financial systems; Testing life threatening systems; Testing emergency systems; Testing sensor-based systems; Testing testing systems
최종 수정: Dou Sun ()

관련 학회

관련 저널

CCF정식 명칭영향력 지수출판사ISSN
Journal of Electronic Testing1.3Springer0923-8174
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems5.9Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203
IEEE Access3.6IEEE2169-3536

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