학회 정보

RQD 2020: ISSAT International Conference on Reliability and Quality in Design

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투고 마감일:
2020-04-15 Extended
통보일:
2020-04-30
개최일:
2020-08-06
개최지:
Miami, Florida, USA
개최 횟수:
26
조회: 13431   팔로우: 0   참가: 0

논문 모집

RQD 2020 (ISSAT International Conference on Reliability and Quality in Design) is an academic conference held in Miami, Florida, USA on 2020-08-06. The paper submission deadline is 2020-04-15 (extended). Acceptance notifications are sent on 2020-04-30.

About the Conference RQD 2020 is a major international conference event in the fields of reliability, risk assessment, quality in designs and statistics. For a quarter of a century, ISSAT RQD conference has brought together internationally renowned scholars, professors and researchers as well as scientists, engineers, practitioners, professionals and students worldwide to share, discuss and advance their research findings. The presented papers as well as keynote addresses were of high quality. ISSAT RQD conference has been greatly beneficial to its participants for their research and a starting place for many new collaborative works. Topics of Interest Reliability Reliability Modeling and Testing Software Reliability and Testing Human Factors and Reliability Statistical Approaches in Reliability Network Reliability Risk Assessment Modeling Fault Tolerance Modeling Analysis and Simulation Quality Assurance and Cost Issues Optimization Survival Data Analysis Quality Engineering Quality Planning and Measurements Maintainability and Availability Methodologies for Quality Control Software and Algorithms Total Quality Management Techniques Design Issues in Manufacturing Engineering Design Optimization Experimental Design for Quality Control Performance Analysis Process Control and Management Parallel and Distributed Computing Concurrent Engineering and Design Big Data Cloud Computing Data Collection and Analysis Data Computing Data Mining and Analytics Life Testing Robust Design Security Analytics Safety-Critical and High Assurance Systems Service Sciences
최종 수정: Dou Sun ()

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관련 저널

CCF정식 명칭영향력 지수출판사ISSN
International Journal of Reliability, Quality and Safety EngineeringWorld Scientific0218-5393
CIEEE Transactions on Reliability5.7IEEE0018-9529
Microelectronics Reliability1.9Elsevier0026-2714
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655

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