The ICMIE conference is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Instrumentation and Electronics. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world.

Topics of interest for submission include, but are not limited to: 

*Measurement, Instruments & Test

Educational Instrument & Experimental System
Electronic Instrument & Measurement System
MEMS Instruments and Test System
Microprocessor and Embedded System
Optical Instrument & Measurement System
Precision Instruments & Measurement System
Scientific Experiment and Analytic Instrument
Testability and Built-in-test
Virtual Instrument
VLSI Testing and Fault Diagnosis

*Measurement & Test Information Processing

Cyber Physical System
Data Acquisition System and Technology
Image Processing
IOT: Internet of Things
Machine Learning and Pattern Recognition
Massive Data Management and Analysis
Measurement Error Theory
Measurement System and Theory
Networks in Test and Measurement
Non-electric Measurement
Reconfigurable Computing Sensors Fusion
Sensor Network
Sensors and Transducers
Signal Analysis and Processing
Signal Transmission and Data Bus
Virtual Measurement

*Electronics Engineering

Biomedical Electronics
Communication Theory and Systems
Control Theory and Applications
Electrical Machines and Drives
Signal Processing
Electrical Materials Electromagnetics
Electronics Instrumentation
High Voltage Techniques Microwave
Intelligent Systems Sensors
Mechatronics
Multi-robot System
Optoelectronics
Power Electronics and Applications
Robotics and Automation Systems