| 1986 | ITC | Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials |
| 1986 | ITC | Reliability and IC Electrical Properties of Gate Oxide Shorts |
| 1986 | ITC | ISDN Device Testing Demands A New Level of Performance from Automatic Test Equipment |
| 1986 | SIGGRAPH | Free-form deformation of solid geometric models |
| 1985 | ITC | The Electrical Behavior of Gate-Oxide Short Defects |
| 1985 | SIGGRAPH | An image synthesizer |
| 1984 | AAAI | The Tractability of Subsumption in Frame-Based Description Languages |
| 1984 | AAAI | Choices without Backtracking |
| 1984 | AAAI | A Logic of Implicit and Explicit Belief |
| 1984 | AAAI | Shading into Texture |
| 1984 | FSE | Generation Scavenging: A non-disruptive high performance storage reclamation algorithm |
| 1984 | ITC | Random Testing for Stuck-at-Storage Cells in an Embedded Memory |
| 1984 | SIGMOD | R-Trees: A Dynamic Index Structure for Spatial Searching |
| 1983 | ITC | Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems |
| 1983 | ITC | HITEST – Intelligent Test Generation |
| 1983 | ITC | New Techniques for High-Speed Analog Testing |
| 1982 | ITC | Testability Measures – What do they tell us? |
| 1981 | ITC | Automated Measurement of 12- to 16-bit Converters |
| 1981 | SIGMOD | The K-D-B-Tree: A Search Structure For Large Multidimensional Dynamic Indexes |
| 1980 | ITC | Soft Error Testing |
| 1980 | ITC | A New Approach to High-Speed Codec Testing |
| 1980 | ITC | Testing for Bipolar Integrated Circuit Failures |
| 1980 | ITC | Electron Beam Testing of Microprocessors |
| 1979 | ITC | Design for Self-Verification: An Approach for Dealing with Testability Problems in VLSI-Based Designs |
| 1979 | SIGMOD | Access Path Selection in a Relational Database Management System |
| 1979 | SOSP | Weighted Voting for Replicated Data |
| 1977 | POPL | Abstract Interpretation: A Unified Lattice Model for Static Analysis of Programs by Construction or Approximation of Fixpoints |