Basic Information
Name: Ye Sun
Institution: JiLin University
Registration: 2021-07-08
Score: 2043
Tracked Conferences
CCFCOREQUALISShortFull NameSubmissionNotificationConference
aa*MMACM Multimedia2024-04-082024-07-082024-10-28
baa1ECCVEuropean Conference on Computer Vision2024-03-072024-05-092024-09-29
aa*a1ICMLInternational Conference on Machine Learning2024-02-012024-05-012024-07-21
aa*a1IJCAIInternational Joint Conference on Artificial Intelligence2024-01-172024-04-162024-08-03
aa*a1CVPRIEEE Conference on Computer Vision and Pattern Recognition2023-11-032024-02-262024-06-17
aa*a1AAAIAAAI Conference on Artificial Intelligence2023-08-082023-12-092024-02-20
aa1NeurIPSConference on Neural Information Processing Systems2023-05-172023-09-222023-12-10
aa*a1ICCVInternational Conference on Computer Vision2023-03-082022-07-132023-09-30
ICLRInternational Conference on Learning Representations2021-09-292022-01-242022-04-25
ShortFull NameSubmissionConference
MMACM Multimedia2024-04-082024-10-28
ECCVEuropean Conference on Computer Vision2024-03-072024-09-29
ICMLInternational Conference on Machine Learning2024-02-012024-07-21
IJCAIInternational Joint Conference on Artificial Intelligence2024-01-172024-08-03
CVPRIEEE Conference on Computer Vision and Pattern Recognition2023-11-032024-06-17
AAAIAAAI Conference on Artificial Intelligence2023-08-082024-02-20
NeurIPSConference on Neural Information Processing Systems2023-05-172023-12-10
ICCVInternational Conference on Computer Vision2023-03-082023-09-30
ICLRInternational Conference on Learning Representations2021-09-292022-04-25
Attend Conferences
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Tracked Journals
CCFFull NameImpact FactorPublisherISSN
aIEEE Transactions on Pattern Analysis and Machine Intelligence17.73IEEE0162-8828
Full NameImpact FactorPublisher
IEEE Transactions on Pattern Analysis and Machine Intelligence17.73IEEE
Followed Researchers
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Tracked Jobs
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Viewed Conferences
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Viewed Journals
CCFFull NameImpact FactorPublisherISSN
aJournal of Machine Learning Research Microtome Publishing1532-4435
aIEEE Transactions on Pattern Analysis and Machine Intelligence17.73IEEE0162-8828
Full NameImpact FactorPublisher
Journal of Machine Learning Research Microtome Publishing
IEEE Transactions on Pattern Analysis and Machine Intelligence17.73IEEE