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CCF: Journal Rank (A, B, C) from China Computer Federation (2022)
Mostrando 871-900 de 1,195 elementos.
CCFAbreviaciónNombre CompletoFactor de ImpactoEditorISSNVistas
Journal of Medical Systems5.7Springer0148-559813460
Information Systems Management3.9Taylor & Francis1058-053013454
Computers & Chemical Engineering3.9Elsevier0098-135413444
Journal of Documentation1.700Emerald0022-041813423
Sensing and Bio-Sensing Research4.9Elsevier2214-180413419
Online Information Review3.5Emerald1468-452713412
Geographical Abstracts: Physical GeographyElsevier0954-050413402
Entertainment Computing2.4Elsevier1875-952113401
IETE Journal of Research1.300Taylor & Francis0377-206313344
EAI Endorsed Transactions on Collaborative ComputingEUDL2312-862313343
Integrated Computer-Aided Engineering5.3IOS Press1069-250913342
Mathematical Methods of Operations Research0.900Springer1432-299413325
Safety Science5.4Elsevier0925-753513324
Journal of Molecular Graphics and Modelling3.0Elsevier1093-326313319
Advanced Modeling and Simulation in Engineering Sciences3.2Springer2213-746713307
IJASEITInternational Journal on Advanced Science, Engineering and Information TechnologyINSIGHT2088-533413301
Journal of Semantics1.1Oxford University Press0167-513313299
ST&HVScience, Technology, & Human Values3.3SAGE0162-243913297
International Journal of Numerical Methods for Heat & Fluid Flow5.1Emerald0961-553913297
Information and Organization4.7Elsevier1471-772713256
IJDSTInternational Journal of Distributed Systems and TechnologiesIGI Global Publishing1947-353213237
Mathematical and Computer Modelling of Dynamical Systems1.8Taylor & Francis1387-395413207
cJETTAJournal of Electronic Testing: Theory and Applications1.100Springer0923-817413204
International Journal for Numerical Methods in Fluids1.8Wiley-Blackwell0271-209113197
Molecular Diversity3.8Springer1381-199113175
ADSAdvances in Decision SciencesHindawi2090-335913169
Journal of Object TechnologyEtH Zurich1660-176913165
Optimal Control Applications and Methods1.5Wiley-Blackwell0143-208713163
International Journal of Computer Integrated Manufacturing4.0Taylor & Francis0951-192X13147
The Photogrammetric Record3.6Wiley-Blackwell0031-868X13123