학회 정보

ICTSS 2025: International Conference on Testing Software and Systems

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ICTSS
투고 마감일:
2025-06-16 Extended
통보일:
2025-07-14
개최일:
2025-09-17
개최지:
Limassol, Cyprus
개최 횟수:
37
ICORE: C   QUALIS: B1   조회: 23635   팔로우: 0   참가: 0

논문 모집

ICTSS 2025 (International Conference on Testing Software and Systems) is a ICORE C / QUALIS B1 conference held in Limassol, Cyprus on 2025-09-17. The paper submission deadline is 2025-06-16 (extended). Acceptance notifications are sent on 2025-07-14.

IFIP-ICTSS is a well-established conference where researchers, developers, testers, and users from industry get together to present and discuss the most recent innovations, experiences and open challenges related to testing software and systems and measuring software quality. Topics of interest include, but are not limited to: Aspects of testing: test derivation, test selection, test generation, test coverage, test concretization, test implementation and execution, test result analysis, test oracle, verdict computation, test management, active testing and passive testing, monitoring and runtime verification. Testing new technologies: this year we encourage submissions focused on testing Large Language Models (LLMs), audit machine learning systems (especially for applications to health) and Quantum systems (programs, computers, and simulators). Diversity on testing: diverse generation, selecting diverse test suites, foundations of testing and diversity, applications of entropy and Kolmogorov complexity on test suite diversity. Theoretical approaches: formalisms (such as automata, state machines, process algebra, logics, Markov-chains…), testing frameworks, results for compositionality, refinement, soundness and completeness, addressing complex systems, heterogeneous or hybrid systems. Modelling languages (such as UML, MATLAB, Simulink, Modelica…) and associated tooling for model-based testing: test generation from models, model-based oracles. Scalability, traceability, quantification issues. Automated support of any parts of the testing activities, testing processes, test-driven development, sound metrics and measurements. Testing of quality aspects: Functional, interoperability, unit, integration, performance, load, conformance, non-regression, reliability, robustness. Security Testing: methodologies and techniques for continuous security assessment, security monitoring, security review, penetration testing, verification of certification compliance; automation of security testing processes. Cross domains and combination of techniques: using other techniques such as proof, model-checking, symbolic execution, abstract interpretation, static analysis, simulation, model learning, machine learning, expert systems, neural networks, genetic algorithms… to improve quality and reduce the effort in testing processes. Application aspects and case studies: Communicating systems such as cyberphysical systems, systems of systems, embedded systems, web services systems, smart grids, cloud computing systems, business information systems, real-time systems, distributed and concurrent systems. Case studies and industrial applications involving qualified empirical evaluations.
최종 수정: Dou Sun ()

게재율

평균 게재율: 45.5% 9년간 (2000–2009).

연도투고 수게재 수게재율(%)
2009371335.1%
2008421842.9%
2007802430%
2006482347.9%
2005522446.2%
2004392256.4%
2003532445.3%
2002542648.1%
2000331957.6%

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BA*IJCAIInternational Joint Conference on Artificial Intelligence2026-01-312026-08-15
AA*STOCACM Symposium on Theory of Computing2025-11-042026-02-012026-06-22
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CBIJCNNInternational Joint Conference on Neural Networks2027-01-312027-03-152027-06-14
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관련 저널

CCF정식 명칭영향력 지수출판사ISSN
Journal of Electronic Testing1.3Springer0923-8174
Software Testing Verification and Reliability1.2Wiley0960-0833
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203

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