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NSS/MIC 2015: Nuclear Science Symposium and Medical Imaging Conference

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NSS/MIC
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投稿締切日:
2015-05-05
通知日:
開催日:
2015-10-31
開催地:
San Diego, California, USA
閲覧: 21626   フォロー: 0   参加: 0

会伴インデックス (CP-I)

42.1 / 100
全 5,693 件中 第 4,159 位 · 上位 74%

バイオインフォマティクス・医療情報学 分野 184 件中 第 127 位 コンピュータビジョン・パターン認識 分野 246 件中 第 210 位

根拠が限られています:この会議は CCF / ICORE / QUALIS のいずれにも収録されておらず、採択率のデータもないため、スコアの大部分は中立の基準値に戻ります。
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開催回数 (20%) データなし — 中立の基準値 50 点として算入 —
コミュニティの注目度 (10%)
8
公開情報の充実度 (15%)
25

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論文募集

NSS/MIC 2015 (Nuclear Science Symposium and Medical Imaging Conference) is an academic conference held in San Diego, California, USA on 2015-10-31. The paper submission deadline is 2015-05-05.

The 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference together with the Symposium on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors will be held at the Town & Country Hotel in San Diego, California, from October 31st to November 7th. This conference is the premier meeting on the use of instrumentation in the Nuclear and Medical fields. The meeting has a very long history of providing an exciting venue for scientists to present their latest advances, exchange ideas, renew existing collaboration and form new ones. The NSS portion of the conference is an ideal forum for scientists and engineers in the field of Nuclear Science, radiation instrumentation, software engineering and data acquisition. The MIC is one of the most informative venues on the state-of-the art use of physics, engineering, and mathematics in Nuclear Medicine and related imaging modalities, such as CT and increasingly so MRI, through the development of hybrid devices. The RTSD is an ideal companion to both the NSS and MIC segments of the conference and impacts both interest areas. There is synergy and overlap between the three main areas of the conference. Several joint sessions are planned to further foster discussions between scientists that work on similar problems, but possibly in different areas. Such an interdisciplinary flavor offers an excellent milieu to students and postdoctoral fellows; a presentation at this meeting is indeed almost a ‘right of passage’ for a student in his or her research career, as they have an opportunity to interact and learns from world experts in the field. Every effort will be made to provide as much student support as possible to make this unique scientific and educational experience more easily accessible. As in the past years, the educational content of the conference will be enriched by special focus workshops and educational seminars. The conference will also provide an industrial exhibits area where the providers and developers of many of the technical tools and services used by our attendees will be presenting their products and the chance to talk to their corporate scientists and engineers. The exhibit space will be specifically setup to allow both the exhibitors and attendees amble space for discussions and exploration of common interests. Some of you might already be familiar with this conference location in sunny San Diego, California. However you will be pleasantly surprised by the renovated conference facilities resulting in more spacious poster sessions, lecture halls, excellent IT services and pleasant outdoor and indoor atmosphere. An excellent companion program is being assembled and will include cultural and sightseeing events. This conference has always combined outstanding science, innovation and brought together old and new friends in a relaxed atmosphere. The entire organizing committee is working towards living up to the long-standing tradition of excellence. Considering however that a conference standard is mostly determined by the scientific contributions of the attendees, we are certain that we all will enjoy several days of excitement and discovery. On behalf of the entire organizing committee I would like to sincerely welcome you to the 2015 IEEE NSS/MIC and RTSD.
最終更新:Dou Sun()

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CCF正式名称インパクトファクター出版社ISSN
Journal of Nuclear Materials3.3Elsevier0022-3115
Computerized Medical Imaging and Graphics4.9Elsevier0895-6111
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems5.9Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203

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