Conference Information

ICPAMI 2026: International Conference on Pattern Analysis and Machine Intelligence

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ICPAMI
Submission Date:
2026-07-12
Notification Date:
2026-09-21
Conference Date:
2026-12-18
Location:
China
Years:
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Call For Papers

ICPAMI 2026 (International Conference on Pattern Analysis and Machine Intelligence) is an academic conference held in China on 2026-12-18. The paper submission deadline is 2026-07-12. Acceptance notifications are sent on 2026-09-21.

The primary focus of the conference is on new and original research results in the areas of theoretical findings, design, implementation, and applications. Both theoretical paper and simulation (experimental) results are welcome. Topics of interest include, but are not limited to, the following: Computer Vision and Recognition: Active and Robot Vision Biometric Authentication Camera Networks and Vision Cognitive and Biologically Inspired Vision Fuzzy and Neural Techniques in Vision Face and Gesture Recognition Image Feature Extraction Novel Vision Application and Case Studies Machine Learning Technologies for Vision Object Recognition Sensors and Early Vision Image Processing and Analysis: Optical imaging 3D Imaging Enhancement Techniques Image Compression, Coding, and Encryption Image Generation, Acquisition, and Processing Image Geometry and Multi-view Geometry Image Restoration Image-based Modeling and Algorithms Mathematical Morphology Multi-resolution Imaging Techniques Multimedia and Applications: Multimedia Systems and Applications Novel Image Processing Applications Video Analysis Industrial Inspection Nondestructive Evaluation Watermarking Methods and Protection + Wavelet Methods Techniques and Tools for Imaging and Vision: Segmentation Techniques Software Tools for Imaging Soft Computing Methods in Image Processing and Vision Special-purpose Machine Architectures for Vision Medical and Geospatial Imaging: Medical Image Processing and Analysis Novel Document Image Understanding Techniques Geographic Information System Remote Sensing Pattern Recognition and Machine Learning: Stereo Vision Bayesian Methods in Pattern Recognition and Matching Case studies and Emerging technologies Clustering Techniques Dimensionality Reduction Methods in Pattern Recognition Ensemble Learning Algorithms Invariance in Pattern Recognition Knowledge-based Pattern Recognition Parsing Algorithms Statistical Pattern Recognition Structural and Syntactic Pattern Recognition Supervised and Un-supervised Classification Algorithms Symbolic Learning
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Related Journals

CCFFull NameImpact FactorPublisherISSN
AIEEE Transactions on Pattern Analysis and Machine Intelligence20.8IEEE0162-8828
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655
BPattern Recognition7.6Elsevier0031-3203
IEEE Access3.6IEEE2169-3536

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