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STAML 2024: International Conference on Software Testing and Analysis and Machine Learning

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STAML
投稿締切日:
2024-06-14 Extended
通知日:
開催日:
2024-06-28
開催地:
Wuhan, China
閲覧: 10849   フォロー: 2   参加: 1

論文募集

STAML 2024 (International Conference on Software Testing and Analysis and Machine Learning) is an academic conference held in Wuhan, China on 2024-06-28. The paper submission deadline is 2024-06-14 (extended).

Software is becoming more and more important to all aspects of society. Software applications in many situations. Testing and Analysis of the software will shed light on its robustness and debugging. Machine Learning digging so much information. We aim for innovative research in the field of software testing and analysis and machine learning. Topics of the Conference We solicit original papers including but not limited to:​ Topic 1：Machine Learning ﹥Neural Networks ﹥Deep Learning ﹥Convolutional Networks ﹥Reinforcement​ ﹥Data Mining in Heterogeneous Networks ﹥Deep and Reinforcement Learning ﹥Distributed and Decentralized Machine Learning Algorithms ﹥Human-robot Interface and Interaction ﹥Network Slicing Optimization ﹥User Behavior Prediction ﹥Machine Learning in Knowledge-Intensive Systems ​﹥Machine Learning Methods and Analysis ​﹥Mechanism Design and Applications ​﹥Mobile Sensor Networks ​﹥Modeling and Identification ​﹥Multi-agent Systems ​﹥Natural Language Processing ​﹥Pattern Recognition and Classification for Networks ​﹥Robotic Automation and Control ​﹥Mechanism Design and Applications ​﹥Mobile Sensor Networks ​﹥Modeling and Identification ​﹥Multi-agent Systems ​﹥Natural Language Processing ​﹥Pattern Recognition and Classification for Networks ​﹥Robotic Automation and Control ​﹥Mechanism Design and Applications ​﹥Mobile Sensor Networks ​﹥Modeling and Identification ​﹥Multi-agent Systems ​﹥Natural Language Processing ​﹥Pattern Recognition and Classification for Networks ​﹥Robotic Automation and Control ﹥Computer Security ﹥Data Validation ﹥Python ﹥System Software Topic 2：Nature of Software ﹥Application Software,VR Application,Mobile Application,Andriod Application ﹥Engineering and Scientific Software ﹥Embedded Software ﹥Web Application ﹥Artificial Intelligence Software ﹥AI Architecture and Practice ﹥AI Model and Algorithms ﹥Artificial Intelligence in Modeling and Simulation ﹥Artificial Intelligence in Scheduling and Optimization ﹥Cloud Computing Architecture ﹥Computer Vision and Object Recognition ﹥Concurrent and Parallel Processing ﹥Coordination in Robotics ﹥Data Visualization and Modern Technologies ﹥Distributed Intelligent Processing ﹥Intelligence and Language ﹥Intelligent Wireless Communications ﹥Intelligent Wireless Sensor Networks ﹥Internet of Things ﹥Software Frameworks and Simulations Topic3:Testing and Analysis ﹥Failure-inducing Inputs ﹥Fuzzing ﹥ARM Disassembly Tools ﹥Semi-implicit Parallelization ﹥Automated Classification ﹥Automated Program ﹥Context-aware Neural Translation Models ﹥Data Loss Detector ﹥Debugging ﹥Robustness ﹥Deep Semantic Learning ﹥Natural Language Processing ﹥Back Deduction ﹥Information Systems Engineering ﹥Word Sense Disambiguation ﹥Behavior Driving Systems ﹥Online Judge Test ﹥Vectorizing Program ﹥Validating Multimedia ﹥Breaking Changes ﹥Vulnerability Detection ﹥Tackling ﹥Label Errors ﹥Type Batched Program ﹥Transforming Test ﹥Fine-tuning ﹥Mutation Testing ﹥Third-party Library Dependency ﹥Call Graph Construction *Other related topics are welcome to submit. For details, please consult the conference secretary.
最終更新：Dou Sun（）

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関連ジャーナル

CCF正式名称インパクトファクター出版社ISSN
BMachine Learning2.9Springer0885-6125
Journal of Electronic Testing1.3Springer0923-8174
Software Testing Verification and Reliability1.2Wiley0960-0833
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems6.1Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.9Elsevier0167-8655

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