Información de la conferencia

SecTech 2015: International Conference on Security Technology

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SecTech
Día de Entrega:
2015-10-10
Fecha de Notificación:
2015-10-30
Fecha de conferencia:
2015-11-25
Ubicación:
Jeju Island, Korea
Ediciones:
8
Vistas: 18260   Seguidores: 3   Asistentes: 0

Solicitud de Artículos

SecTech 2015 (International Conference on Security Technology) is an academic conference held in Jeju Island, Korea on 2015-11-25. The paper submission deadline is 2015-10-10. Acceptance notifications are sent on 2015-10-30.

The goal of this conference is to bring together the researchers from academia and industry as well as practitioners to share ideas, problems and solutions relating to the multifaceted aspects of Security Technology. Topics of Conference The main topics include but will not be limited to: (Excellent surveying works in these areas are welcome, too.) Agent and Mobile Code Security Authorization and Access Control Biometrics Security and Applications Computer Forensics Cryptographic Protocols Data Integrity and Privacy Database Security Intrusion Detection and Prevention Distributed System Security Key Management and Recovery Mobile and Ad hoc network security Operating System Security Secure Hardware and Software Design Smartcards and Chip Security RFID, Sensor Network, Ubiquitous Computing Security Cell phone, PDA, and Potable Device Security Biometrics Products and its Applications Firewall, IDS, Anti-virus, and other Security Products E-Commerce and E-Government Security Intellectual Property Protection Internet and Web Services Security Cyber-attack and Cyber-terrorism Physical Security Security Policy, Strategy and Management Authentication and Identity Management Security Education and Training Personnel Security and Privacy Trust Negotiation, Establishment and Management Vulnerability, Threat, and Risk Analysis Security Requirements Engineering Security in System/Software/Product Development Site Security in Development Processes Security Maturity Model Security Evaluation Criteria and Methodology etc.
Última actualización por Dou Sun el

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