Where is EDTM 2026 held?

EDTM 2026 is held in Penang, Malaysia.

When does EDTM 2026 take place?

EDTM 2026 takes place on 2026-03-01.

会议信息

EDTM 2026: IEEE Electron Devices Technology and Manufacturing Conference

Q: What is the submission deadline for EDTM 2026?

The paper submission deadline for EDTM 2026 (IEEE Electron Devices Technology and Manufacturing Conference) is 2025-11-30.

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截稿日期:

2025-11-30

通知日期:

2025-12-15

会议日期:

2026-03-01

会议地点:

Penang, Malaysia

届数:

10

浏览: 680 关注: 0 参加: 0

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征稿

EDTM 2026 (IEEE Electron Devices Technology and Manufacturing Conference) is an academic conference held in Penang, Malaysia on 2026-03-01. The paper submission deadline is 2025-11-30. Acceptance notifications are sent on 2025-12-15.

EDTM 2026 Conference Tracks Materials Process, Tools Yield and Manufacturing Advanced Semiconductor Logic Devices Memory Technologies Photonics, Imaging and Display Wide-Bandgap Power, RF Devices and Circuits Modeling and Simulation Reliability and Testing Packaging and Heterogeneous Integration Sensor, MEMS, Bio-electronics Flexible and Wearable Electronics Nanotechnologies Neuromorphic & Quantum Technologies Bio-Hybrid Electronics (Invited Only) On-Chip Thermal Management (Invited Only) Quantum Neural Network (Invited Only)

由 Admin Agent 最后更新于 2026-07-15

最佳论文

年份	最佳论文
2026	Low-Temperature Ni-Silicide Initiated Lateral Epitaxial Crystallization with Orientation and Grain Boundary Control for Stackable Transistor Technologies
2026	A Commercial-Grade Reliable 40nm eRRAM Macro Featuring a Dual-Oxide Resistive Switching Layer
2026	Multi-Grain Phase Field Modeling of the Interaction Between Polar-Axis Orientation and FE Phase Probability in Ferroelectric Capacitors
2026	Power Law Yield Model for FinFET Technologies and Beyond
2026	Empirical Approach to Improve the BSIM4 Model for Bulk MOSFETs Scaled Down to Cryogenic Temperature
2026	Study of High Aspect Ratio SiN WG Etch in Silicon Photonics
2026	Highly Selective Radical Etching of Si3N4 using NF3/O2/N2/H2 Mixtures on 3D Multilayer Stack Transistor Integration
2026	In-Plane Anisotropy and Mode Selection in Thin-Film Lithium Niobate for Versatile Filters
2026	Finite Element Modeling and Correcting of Current Shunting Effect in SOT-MTJ for Edge AI

相关会议

CCF	ICORE	简称	全称	截稿日期	通知日期	会议日期
		IEDM	IEEE International Electron Devices Meeting	2025-08-18		2025-12-06
		APEDE	International Conference on Actual Problems of Electron Devices Engineering	2026-07-01	2026-07-25	2026-09-24
		ESREF	European Symposium on Reliability of Electron Devices, Failure Physics and Analysis	2026-03-20		2026-09-21
A	A*	SIGIR	International Conference on Research and Development in Information Retrieval	2026-01-15	2026-04-02	2026-07-20
A	A*	AAAI	AAAI Conference on Artificial Intelligence	2026-07-21	2026-11-30	2027-02-16
A	A*	CVPR	IEEE Conference on Computer Vision and Pattern Recognition	2025-11-06	2026-02-20	2026-06-03
B	A*	ICRA	International Conference on Robotics and Automation			2027-05-24
B	A*	IJCAI	International Joint Conference on Artificial Intelligence	2026-01-31		2026-08-15
A	A*	STOC	ACM Symposium on Theory of Computing	2025-11-04	2026-02-01	2026-06-22
C		ICC	International Conference on Communications	2026-10-02	2027-01-15	2027-05-30

CCF	全称	影响因子	出版商	ISSN
A	IEEE Transactions on Multimedia	9.7	IEEE	1520-9210
C	Knowledge-Based Systems	7.2	Elsevier	0950-7051
B	Software & Systems Modeling	3.2	Springer	1619-1366
A	IEEE Transactions on Computers	3.8	IEEE	0018-9340
C	Future Generation Computer Systems	5.9	Elsevier	0167-739X
C	Neurocomputing	6.5	Elsevier	0925-2312
C	Pattern Recognition Letters	3.9	Elsevier	0167-8655
B	Pattern Recognition	7.6	Elsevier	0031-3203
	IEEE Access	3.6	IEEE	2169-3536
A	IEEE Transactions on Dependable and Secure Computing	7.5	IEEE	1545-5971

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