会议信息

ISEDA 2027: International Symposium of EDA

截稿日期:
2027-02-24 还有 103 天
通知日期:
2027-03-31
会议日期:
2027-05-21
会议地点:
Beijing, China
届数:
请登录查看会议网址
免费注册:查看官网链接、跟踪截稿日期,并接收邮件提醒。
浏览: 10393   关注: 0   参加: 0
嵌入截止倒计时徽章
ISEDA
用 API 获取这条数据
搜索与榜单列表完全无需凭证;本页的完整详情需要一把免费 API 密钥。详见开发者接入页。

会伴指数 (CP-I)

41.3 / 100
全站第 4,894 名 / 共 5,776 个会议 · 前 85%
学术认可 (35%) 无数据 —— 按中性基准 50 分计入 —
投稿选择性 (20%) 无数据 —— 按中性基准 50 分计入 —
会议传承 (20%)
19
社区关注 (10%)
18
资料公开度 (15%)
55

用到的输入: 有据可查的届次:1 · 过去 24 个月打开过本页的研究者:10 人

公开资料里还缺: 历年录用率 (+4.5) · 最佳论文记录 (+2.3)
主办方认领本会议后,可直接在这一页补上;分数每晚重算。如何提升这个分数

置信度 45% —— 分数中有多大比例来自实际观测到的数据,而不是中性基准。 这个分数是怎么算出来的 · 查看完整榜单 · 算法版本 1.2 · 算于 2026-11-13

征稿

ISEDA 2027 (International Symposium of EDA) is an academic conference held in Beijing, China on 2027-05-21. The paper submission deadline is 2027-02-24. Acceptance notifications are sent on 2027-03-31.

Advised by IEEE/CEDA and ACM/SIGDA, and organized by EDA², the ISEDA (International Symposium of EDA) is an annual premier forum dedicated to VLSI design automation. The symposium aims at exploring the new challenges, presenting leading-edge technologies and providing EDA community with opportunities of predicting future directions in EDA research areas. ISEDA covers the full range of EDA topics from device and circuit levels up to system level, from analog to digital designs as well as manufacturing. The format of meeting intends to cultivate productive and novel interchangeable ideas among EDA researcher and developers. Academic and industrial EDA related professionals who are interested in EDA's theoretical and practical research are all welcomed to contribute to ISEDA. Original papers in, but not limited to, the following areas are invited: System-Level Modeling and Design Methodology 1.1 HW/SW co-design, co-simulation and co-verification 1.2 System-level design exploration, synthesis and optimization 1.3 System-level formal verification 1.4 System-level modeling, simulation and validation 1.5 Networks-on-chip and NoC-based system design 1.6 Hardware construction using Scala-embedded languages Memory Architecture and Near/In-Memory Computing 2.1 Storage systems and memory architecture 2.2 On-chip memory architectures and management: scratchpads, compiler-controlled memories, etc. 2.3 Memory/storage hierarchies and management for emerging memory technologies 2.4 Near-memory and in-memory computing Analog and Mixed-Signal Design Automation 3.1 Analog/mixed-signal/RF synthesis 3.2 Analog layout, verification and simulation techniques 3.3 High-frequency electromagnetic simulation of circuits 3.4 Mixed-signal design considerations High-Level, Behavioral, and Logic Synthesis and Optimization 4.1 Digital simulation and emulation 4.2 High-level synthesis 4.3 Logic synthesis 4.4 Synthesis for approximate computing Analysis and Optimization for Power and Timing 5.1 Deterministic/statistical timing analysis and optimization 5.2 Process technology modeling for timing analysis 5.3 Power modeling, analysis and simulation 5.4 Low-power design and optimization at circuit and system levels 5.5 Thermal-aware design and dynamic thermal management 5.6 Energy harvesting and battery management Physical Implementation 6.1 Floorplanning, partitioning, placement and routing optimization 6.2 Interconnect planning and synthesis 6.3 Clock network synthesis 6.4 Physical design of 3D/2.5D ICs and packages (e.g., TSV, interposer, monolithic) 6.5 Post-layout and post-silicon optimization 6.6 Layout verification Testing, Validation, Simulation, and Verification 7.1 RTL and gate-level modeling, simulation and verification 7.2 Circuit-level formal verification 7.3 ATPG, BIST and DFT 7.4 System test and 3D IC test, online test and fault tolerance 7.5 Memory test and repair Design for Manufacturability and Reliability 8.1 Design-technology co-optimization (DTCO) 8.2 Standard and custom cell design and optimization 8.3 Reticle enhancement, lithography-related design optimization and design rule checking 8.4 Design for manufacturability, yield, defect tolerance, cost issues and DFM impact 8.5 Device-, gate- and circuit-level reliability analysis and optimization (e.g., soft errors, aging) 8.6 Post-layout optimization Packaging and Multi-Physics Simulation 9.1 Extraction, TSV and package modeling 9.2 Chiplet design and design tools 9.3 Chip-level thermal simulation 9.4 Packaging stress analysis 9.5 Multi-physics simulation 9.6 Signal/power integrity, EM modeling and analysis Technology and Modeling 10.1 Device compact modeling 10.2 Process design kits 10.3 Semiconductor process and device simulation 10.4 Cell library design, characterization and verification 10.5 New transistor/device and process technologies: spintronic, phase-change, single-electron, 2D materials, etc. Emerging Technologies and Applications 11.1 Biomedical, biochip, nanotechnology and MEMS 11.2 Design automation for 3D ICs and heterogeneous integration 11.3 Design automation for quantum computing 11.4 Design automation for silicon photonics 11.5 Design automation and verification for compound semiconductors AI and Open Source EDA 12.1 Artificial intelligence for EDA 12.2 Cloud and parallel computing for EDA 12.3 Open source EDA 12.4 EDA databases 12.5 EDA standardization
由 Admin Agent 最后更新于

相关会议

相关期刊

CCF全称影响因子出版商ISSN
AIEEE Transactions on Multimedia9.7IEEE1520-9210
CKnowledge-Based Systems7.2Elsevier0950-7051
BSoftware & Systems Modeling3.2Springer1619-1366
AIEEE Transactions on Computers3.8IEEE0018-9340
CFuture Generation Computer Systems5.9Elsevier0167-739X
CNeurocomputing6.5Elsevier0925-2312
CPattern Recognition Letters3.5Elsevier0167-8655
BPattern Recognition9.1Elsevier0031-3203
IEEE Access3.6IEEE2169-3536
AIEEE Transactions on Dependable and Secure Computing7.5IEEE1545-5971

评论 0

暂无评论。

请登录后发表评论