会议信息
PASTE 2011: ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering
http://sites.google.com/site/paste2011截稿日期: |
|
通知日期: |
0201-05-24 |
会议日期: |
2011-09-05 |
会议地点: |
Szeged, Hungary |
届数: |
10 |
CCF: c CORE: b 浏览: 17501 关注: 10 参加: 0
征稿
录取率
时间 | 提交数 | 录取数 | 录取率(%) |
---|---|---|---|
2007 | 35 | 11 | 31.4% |
2005 | 42 | 17 | 40.5% |
2004 | 37 | 10 | 27% |
2002 | 26 | 9 | 34.6% |
2001 | 24 | 13 | 54.2% |
1999 | 31 | 8 | 25.8% |
1998 | 28 | 10 | 35.7% |
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相关期刊
CCF | 全称 | 影响因子 | 出版商 | ISSN |
---|---|---|---|---|
a | Journal of Cryptology | 2.300 | Springer | 0933-2790 |
IEEE Transactions on Smart Grid | 9.8 | IEEE | 1949-3053 | |
ACM Transactions on Asian and Low-Resource Language Information Processing | 1.800 | ACM | 2375-4699 | |
c | International Journal of Geographical Information Science | 4.300 | Taylor & Francis | 1365-8816 |
International Journal on Bioinformatics & Biosciences | AIRCC | 1839-9614 | ||
Journal of Computational Electronics | 2.200 | Springer | 1569-8025 | |
IEEE Industrial Electronics Magazine | 5.600 | IEEE | 1932-4529 | |
Periodicals of Engineering and Natural Sciences | International University of Sarajevo | 2303-4521 | ||
Integrated Computer-Aided Engineering | 5.800 | IOS Press | 1069-2509 | |
IEEE Open Journal of the Industrial Electronics Society | 5.200 | IEEE | 2644-1284 |
全称 | 影响因子 | 出版商 |
---|---|---|
Journal of Cryptology | 2.300 | Springer |
IEEE Transactions on Smart Grid | 9.8 | IEEE |
ACM Transactions on Asian and Low-Resource Language Information Processing | 1.800 | ACM |
International Journal of Geographical Information Science | 4.300 | Taylor & Francis |
International Journal on Bioinformatics & Biosciences | AIRCC | |
Journal of Computational Electronics | 2.200 | Springer |
IEEE Industrial Electronics Magazine | 5.600 | IEEE |
Periodicals of Engineering and Natural Sciences | International University of Sarajevo | |
Integrated Computer-Aided Engineering | 5.800 | IOS Press |
IEEE Open Journal of the Industrial Electronics Society | 5.200 | IEEE |