Conference Information

S+SSPR 2018: IAPR Joint International Workshops on Statistical Techniques in Pattern Recognition and Structural and Syntactic Pattern Recongnition

Please Login to view website of conference

Submission Date:
2018-05-01 Extended
Notification Date:
2018-06-10
Conference Date:
2018-08-17
Location:
Beijing, China
Years:
5
Viewed: 14239   Tracked: 2   Attend: 2

Call For Papers

S+SSPR 2018 (IAPR Joint International Workshops on Statistical Techniques in Pattern Recognition and Structural and Syntactic Pattern Recongnition) is an academic conference held in Beijing, China on 2018-08-17. The paper submission deadline is 2018-05-01 (extended). Acceptance notifications are sent on 2018-06-10.

S+SSPR 2018 is a joint biannual event organized by Technical Committee 1 (Statistical Pattern Recognition Technique) and Technical Committee 2 (Structural and Syntactical Pattern Recognition) of the International Association of Pattern Recognition (IAPR). Following the trend of previous editions, S+SSPR 2018 will be held in close proximity and shortly before the International Conference on Pattern Recognition (ICPR). This time the workshops will be hosted by Beihang University. Successful authors are invited to submit papers addressing any topic in statistical, structural or syntactic pattern recognition and their applications. Related Special Issue Papers from this conference will be invited to submit their substantially expanded papers to a Special Issue " Recent Advances in Statistical, Structural and Syntactic Pattern Recognition", which will be published in Pattern Recognition Letters in 2019. Possible topics of interest include,but are not limited to: SPR Topics Classification; Prediction Gaussian Processes; Randomized Algorithms Multiple Classifiers; Ensemble Methods Model Selection; Feature Selection Dimensionality Reduction Dissimilarity Representations Metric Learning; Representation Learning Multiple Instance Learning Clustering Semi-Supervised Learning Weakly-supervised Learning Active Learning; Novelty Detection Deep Learning; Neural Networks Adversarial Learning; Reinforcement Learning Transfer Learning; Domain Adaptation Data Complexity; Data Modeling Security of Machine Learning SSPR Topics Structural Matching Structural Complexity Syntactic Pattern Recognition Graph-theoretic Methods Graphical Models Structural Kernels Spectral Methods Spatio-Temporal Pattern Recognition Structured Text Analysis Stochastic Structural Models Intelligent Sensing Systems Multimedia Analysis Multimedia Retrieval Image Document Analysis Image Understanding Shape Analysis
Last updated by Sun Peng in

Related Conferences

CCFCOREQUALISShortFull NameSubmissionNotificationConference
aa*a1AAAIAAAI Conference on Artificial Intelligence2025-07-252025-11-032026-01-20
aa*a1SIGIRInternational Conference on Research and Development in Information Retrieval2026-01-152026-04-022026-07-20
aa*a1CVPRIEEE Conference on Computer Vision and Pattern Recognition2025-11-062026-02-202026-06-03
bba1ICRAInternational Conference on Robotics and Automation2025-09-152026-06-01
aa*a1IJCAIInternational Joint Conference on Artificial Intelligence2026-01-312026-08-15
aa*a1STOCACM Symposium on Theory of Computing2025-11-042026-02-012026-06-22
cba2ICCInternational Conference on Communications2025-10-132026-01-122026-05-24
caa2IJCNNInternational Joint Conference on Neural Networks2025-01-152025-03-312025-06-30
bba1ICASSPInternational Conference on Acoustics, Speech and Signal Processing2025-09-172026-01-162026-05-04
ba*a1PODSACM SIGMOD Conference on Principles of DB Systems2026-12-032027-03-012027-06-13

Related Journals

CCFFull NameImpact FactorPublisherISSN
International Journal of Pattern Recognition & Artificial IntelligenceWorld Scientific0218-0014
Statistical MethodologyElsevier1572-3127
bIEEE Transactions on Multimedia9.7IEEE1520-9210
cKnowledge-Based Systems7.2Elsevier0950-7051
bSoftware & Systems Modeling3.2Springer1619-1366
aIEEE Transactions on Computers3.8IEEE0018-9340
cFuture Generation Computer Systems6.1Elsevier0167-739X
cNeurocomputing6.5Elsevier0925-2312
cPattern Recognition Letters3.9Elsevier0167-8655
IEEE Access3.6IEEE2169-3536